{"title":"疏散点源:应用于微球辅助超分辨率显微镜。","authors":"Rayenne Boudoukha, Stéphane Perrin, Assia Guessoum, Nacer-E Demagh, Paul Montgomery, Sylvain Lecler","doi":"10.1364/OL.542794","DOIUrl":null,"url":null,"abstract":"<p><p>In the rigorous electromagnetic simulation of an imaging system, the evanescent waves from a point source or from a sample are naturally mixed with the propagative waves. Therefore, their contributions are difficult to distinguish. We present a point-source model made of only the evanescent waves. To illustrate its potential, the model is applied to the study of the evanescent-wave contribution in microsphere-assisted microscopy (MAM). The contribution of the evanescent waves in the microsphere imaging process is clearly demonstrated. However, we also show that this contribution is not enough to justify the super-resolution. The destructive interference between two close point sources may be the key physical phenomenon.</p>","PeriodicalId":19540,"journal":{"name":"Optics letters","volume":"49 22","pages":"6429-6432"},"PeriodicalIF":3.1000,"publicationDate":"2024-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Evanescent point sources: application to microsphere-assisted super-resolution microscopy.\",\"authors\":\"Rayenne Boudoukha, Stéphane Perrin, Assia Guessoum, Nacer-E Demagh, Paul Montgomery, Sylvain Lecler\",\"doi\":\"10.1364/OL.542794\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><p>In the rigorous electromagnetic simulation of an imaging system, the evanescent waves from a point source or from a sample are naturally mixed with the propagative waves. Therefore, their contributions are difficult to distinguish. We present a point-source model made of only the evanescent waves. To illustrate its potential, the model is applied to the study of the evanescent-wave contribution in microsphere-assisted microscopy (MAM). The contribution of the evanescent waves in the microsphere imaging process is clearly demonstrated. However, we also show that this contribution is not enough to justify the super-resolution. The destructive interference between two close point sources may be the key physical phenomenon.</p>\",\"PeriodicalId\":19540,\"journal\":{\"name\":\"Optics letters\",\"volume\":\"49 22\",\"pages\":\"6429-6432\"},\"PeriodicalIF\":3.1000,\"publicationDate\":\"2024-11-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optics letters\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://doi.org/10.1364/OL.542794\",\"RegionNum\":2,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics letters","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1364/OL.542794","RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"OPTICS","Score":null,"Total":0}
Evanescent point sources: application to microsphere-assisted super-resolution microscopy.
In the rigorous electromagnetic simulation of an imaging system, the evanescent waves from a point source or from a sample are naturally mixed with the propagative waves. Therefore, their contributions are difficult to distinguish. We present a point-source model made of only the evanescent waves. To illustrate its potential, the model is applied to the study of the evanescent-wave contribution in microsphere-assisted microscopy (MAM). The contribution of the evanescent waves in the microsphere imaging process is clearly demonstrated. However, we also show that this contribution is not enough to justify the super-resolution. The destructive interference between two close point sources may be the key physical phenomenon.
期刊介绍:
The Optical Society (OSA) publishes high-quality, peer-reviewed articles in its portfolio of journals, which serve the full breadth of the optics and photonics community.
Optics Letters offers rapid dissemination of new results in all areas of optics with short, original, peer-reviewed communications. Optics Letters covers the latest research in optical science, including optical measurements, optical components and devices, atmospheric optics, biomedical optics, Fourier optics, integrated optics, optical processing, optoelectronics, lasers, nonlinear optics, optical storage and holography, optical coherence, polarization, quantum electronics, ultrafast optical phenomena, photonic crystals, and fiber optics. Criteria used in determining acceptability of contributions include newsworthiness to a substantial part of the optics community and the effect of rapid publication on the research of others. This journal, published twice each month, is where readers look for the latest discoveries in optics.