利用紫外纳米压印光刻技术制造光纤耦合波导光栅芯片传感器

IF 5.6 2区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Qiaoling Chen;Jianxin Cui;Zengling Ran;Xiu He;Xiaoxue Ruan;Shengyi Qiu;Yanbo Xiao;Qingqiang Zhu;Fei Zhang;Gaoli Xiao;Ziqiang Chen;Jiahui Yu;Yuan Gong
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引用次数: 0

摘要

据我们所知,这是首次提出并展示一种基于法诺共振效应的新型光纤耦合波导光栅芯片器件。该器件采用紫外纳米压印光刻技术(UV-NIL)制作,具有成本低、易于量产等优点。这种装置可以实现折射率(RI)和压力等多功能传感,因为在外部参数变化的情况下,导模的有效 RI 和光栅周期的变化会引起谐振波长的偏移。通过实验验证,RI 灵敏度为 59.29 nm/RIU,压力灵敏度为 0.89 nm/MPa,铜离子浓度检测灵敏度为 3.40 pm/ $\mu $ M。此外,还实现了芯片传感功能,通过光纤扫描对每个阵列传感单元进行询问。这种光纤耦合波导光栅芯片传感器不仅能实现阵列传感,还能测量各种物理和化学参数。它可以在生物化学和工业领域找到重要的应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Optical Fiber-Coupled Waveguide Grating Chip Sensor Fabricated by Ultraviolet Nanoimprint Lithography
A novel optical fiber-coupled waveguide grating chip device based on Fano resonance effect is proposed and demonstrated for the first time, to the best of our knowledge. It is fabricated by ultraviolet nanoimprint lithography (UV-NIL), with the advantages of low-cost and easy mass production. Such a device can perform multifunctional sensing such as refractive index (RI) and pressure because the variations of the effective RI of the guide mode and the grating period will cause the resonant wavelength shifts under the change of external parameters. Through experimental verification, a RI sensitivity of 59.29 nm/RIU and a pressure sensitivity of 0.89 nm/MPa, a copper ion concentration detection sensitivity of 3.40 pm/ $\mu $ M are achieved, respectively. Furthermore, the chip sensing function is realized, and each arrayed sensing unit is interrogated through optical fiber scanning. This kind of optical fiber-coupled waveguide grating chip sensor can not only realize array sensing but also measure various physical and chemical parameters. It could find important applications in biochemical and industrial fields.
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来源期刊
IEEE Transactions on Instrumentation and Measurement
IEEE Transactions on Instrumentation and Measurement 工程技术-工程:电子与电气
CiteScore
9.00
自引率
23.20%
发文量
1294
审稿时长
3.9 months
期刊介绍: Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.
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