基于阵列狭缝的 Nanoradians 级高分辨率自动对准方法。

IF 3.2 2区物理与天体物理 Q2 OPTICS

Optics express Pub Date : 2024-07-15 DOI:10.1364/OE.528006

Yang Yu, Yuechao Li, Weixuan Zhang, Yunhan Zhang, Jiubin Tan

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引用次数: 0

摘要

这项研究建立了一个详细的数学模型，以阐明阵列狭缝成像和线性 CCD 采集。频域分析揭示了系统参数与光斑图像混叠噪声之间的关系。通过优化阵列狭缝设计和线性 CCD 参数选择，降低了混叠噪声，提高了角度测量分辨率和稳定性。与传统方法不同的是，只需要 8 个阵列狭缝就能达到纳米级的分辨率和稳定性。在 ±400 弧秒的测量范围内，该装置的角度测量分辨率达到了 0.0005 弧秒。静态重复性为 0.0003 弧秒，2 小时内的稳定性为 0.0061 弧秒。

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Nanoradians level high resolution autocollimation method based on array slits.

This study developed a detailed mathematical model to elucidate array slits imaging and linear CCD acquisition. Frequency domain analysis revealed the relationship between system parameters and spot image aliasing noise. Aliasing noise was reduced through optimized array slits design and linear CCD parameter selection, improving angular measurement resolution and stability. Unlike in traditional methods, only 8 array slits were required to achieve nanoradian-level resolution and stability. The device achieved an angular measurement resolution of 0.0005 arcsec over a measurement range of ±400 arcsec. Static repeatability is 0.0003 arcsec, and stability is 0.0061 arcsec in 2 hours.

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来源期刊

Optics express 物理-光学

CiteScore

6.60

自引率

15.80%

发文量

5182

审稿时长

2.1 months

期刊介绍： Optics Express is the all-electronic, open access journal for optics providing rapid publication for peer-reviewed articles that emphasize scientific and technology innovations in all aspects of optics and photonics.