电子显微镜中的单电子自相干性及其波粒二象性

IF 2.9 4区 工程技术 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY
C Kisielowski, P Specht, J R Jinschek, S Helveg
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引用次数: 0

摘要

电子显微镜通过检测单个电子,在高分辨率相位对比图像中形成离散的时间强度。对电子与物质的脉冲式相干非弹性相互作用的波描述意味着相干部分波的时间共存。它们的叠加通过相位退相干形成一个 0.5 - 1 弧度的波包,其海森堡能量不确定性ΔEH = ħ/2 Δt-1与相干-非弹性相互作用的能量损失ΔE相匹配,并设定了相互作用时间Δt。在这种情况下,普朗克常数与光速 hc 的乘积就是时间相干性表达式 λ2/Δλ 与能量损失 ΔE 的乘积。在实验中,利用 Goos-Hänchen 偏移,通过检测散射平面物质波在表面附近随能量变化的定位来测量自相干长度。氮化硼(BN)上的色差 Cc 校正电子显微镜证明,如果自相干长度在 ΔE > 200 eV 时缩小到晶体单元尺寸以下,就会失去相干晶体照明和相位对比。从这个角度来看,任何物质波的相互作用时间与任何元素相互作用的虚拟粒子的寿命相比较,表明目前物质波的相干-非弹性相互作用概念可能是可推广的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Single Electron Self-coherence and Its Wave/Particle Duality in the Electron Microscope.

Intensities in high-resolution phase-contrast images from electron microscopes build up discretely in time by detecting single electrons. A wave description of pulse-like coherent-inelastic interaction of an electron with matter implies a time-dependent coexistence of coherent partial waves. Their superposition forms a wave package by phase decoherence of 0.5 - 1 radian with Heisenbergs energy uncertainty ΔEH = ħ/2 Δt-1 matching the energy loss ΔE of a coherent-inelastic interaction and sets the interaction time Δt. In these circumstances, the product of Planck's constant and the speed of light hc is given by the product of the expression for temporal coherence λ2/Δλ and the energy loss ΔE. Experimentally, the self-coherence length was measured by detecting the energy-dependent localization of scattered, plane matter waves in surface proximity exploiting the Goos-Hänchen shift. Chromatic-aberration Cc-corrected electron microscopy on boron nitride (BN) proves that the coherent crystal illumination and phase contrast are lost if the self-coherence length shrinks below the size of the crystal unit cell at ΔE > 200 eV. In perspective, the interaction time of any matter wave compares with the lifetime of a virtual particle of any elemental interaction, suggesting the present concept of coherent-inelastic interactions of matter waves might be generalizable.

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来源期刊
Microscopy and Microanalysis
Microscopy and Microanalysis 工程技术-材料科学:综合
CiteScore
1.10
自引率
10.70%
发文量
1391
审稿时长
6 months
期刊介绍: Microscopy and Microanalysis publishes original research papers in the fields of microscopy, imaging, and compositional analysis. This distinguished international forum is intended for microscopists in both biology and materials science. The journal provides significant articles that describe new and existing techniques and instrumentation, as well as the applications of these to the imaging and analysis of microstructure. Microscopy and Microanalysis also includes review articles, letters to the editor, and book reviews.
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