屏蔽磁性近场探头的无用磁场耦合机制

IF 2 3区计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-11-13 DOI:10.1109/TEMC.2024.3486170

Xin Yan;Wei Zhang;Sajjad Sadeghi;Mehdi Gholizadeh;David J. Pommerenke;Daryl G. Beetner

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Mechanisms for Unwanted Magnetic Field Coupling to a Shielded Magnetic Near-Field Probe

Unwanted field coupling is a major concern when using magnetic near-field probes for high-frequency scanning. The unwanted coupling of the tangential electric field to a tangential magnetic field probe has been studied extensively. This article shows a second unwanted coupling mechanism: coupling from a vertical magnetic field. The standing wave of a shorted pure TEM microstrip in air is utilized to separate the magnetic and electric field coupling. Simulations show that the eddy currents induced within the probe by the vertical magnetic field couple inductively to the pickup loop if the layer stack up is not symmetric. The unwanted magnetic field coupling mechanism is validated through both simulation and measurement. Two improved designs are proposed to mitigate the impact.

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来源期刊

IEEE Transactions on Electromagnetic Compatibility 工程技术-电信学

CiteScore

4.80

自引率

19.00%

发文量

235

审稿时长

2.3 months

期刊介绍： IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.