用于存储器接口的基于加权-VREF 的环路未展开 DFE 的每DFE 偏移测量和消除

IF 5.6 2区工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Transactions on Instrumentation and Measurement Pub Date : 2024-10-30 DOI:10.1109/TIM.2024.3488135

Yong-Un Jeong;Joo-Hyung Chae

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引用次数: 0

摘要

为了实现较高的输入和输出（I/O）带宽，存储器接口采用了并行 I/O 结构，在这种结构中，系统性失配和随机失配造成的偏移会限制 I/O 带宽；因此，需要进行偏移测量和校正。带有环形未展开决策反馈均衡器（DFE）的接收器可能会在两条环形未展开数据路径之间产生每个 DFE 的偏移，从而降低整体性能。我们提出了一种偏移校准方法，可以识别和调整每个 DFE 的偏移，从而校正多通道之间的每个输入参考偏移。我们在 28 纳米 CMOS 工艺中实现了一个具有双通道接收器的原型，该接收器采用基于单抽头加权 VREF 的 DFE。其能效和面积分别为 0.21 pJ/bit/通道和 0.004 mm2/通道。通过使用 DFE 进行偏移校准，在 12 Gb/s 速率下，三个芯片中总共六个数据通道的误码率 (BER) 为 10-12，眼图 (eye shmoo) 有所改善。

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Per-DFE Offset Measurement and Cancellation of Weighted-VREF-Based Loop-Unrolled DFE for Memory Interfaces

To achieve a high input and output (I/O) bandwidth, memory interfaces adopt a parallel I/O structure, in which the offset caused by systemic and random mismatches can limit the I/O bandwidth; thus, offset measurement and correction are required. A receiver with a loop-unrolled decision feedback equalizer (DFE) can have a per-DFE offset between two loop-unrolled data paths, degrading the overall performance. We propose an offset calibration method that can identify and adjust the per-DFE offset, thereby correcting each input-referred offset between multiple lanes. We implemented a prototype that has a two-lane receiver adopting a one-tap weighted-VREF-based DFE in a 28-nm CMOS process. Its energy efficiency and area are 0.21 pJ/bit/lane and 0.004 mm2/lane, respectively. Through the offset calibration with the DFE, a bit error rate (BER) of 10-12 and an improved eye shmoo were achieved at 12 Gb/s in a total of six data lanes in three chips.

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来源期刊

IEEE Transactions on Instrumentation and Measurement 工程技术-工程：电子与电气

CiteScore

9.00

自引率

23.20%

发文量

1294

审稿时长

3.9 months

期刊介绍： Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.