{"title":"带事件检测功能的超快光场显微镜","authors":"Liheng Bian, Xuyang Chang, Hanwen Xu, Jun Zhang","doi":"10.1038/s41377-024-01603-1","DOIUrl":null,"url":null,"abstract":"<p>The event detection technique has been introduced to light-field microscopy, boosting its imaging speed in orders of magnitude with simultaneous axial resolution enhancement in scattering medium.</p>","PeriodicalId":18069,"journal":{"name":"Light-Science & Applications","volume":"95 1","pages":""},"PeriodicalIF":20.6000,"publicationDate":"2024-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Ultra-fast light-field microscopy with event detection\",\"authors\":\"Liheng Bian, Xuyang Chang, Hanwen Xu, Jun Zhang\",\"doi\":\"10.1038/s41377-024-01603-1\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>The event detection technique has been introduced to light-field microscopy, boosting its imaging speed in orders of magnitude with simultaneous axial resolution enhancement in scattering medium.</p>\",\"PeriodicalId\":18069,\"journal\":{\"name\":\"Light-Science & Applications\",\"volume\":\"95 1\",\"pages\":\"\"},\"PeriodicalIF\":20.6000,\"publicationDate\":\"2024-11-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Light-Science & Applications\",\"FirstCategoryId\":\"1089\",\"ListUrlMain\":\"https://doi.org/10.1038/s41377-024-01603-1\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Light-Science & Applications","FirstCategoryId":"1089","ListUrlMain":"https://doi.org/10.1038/s41377-024-01603-1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"OPTICS","Score":null,"Total":0}
Ultra-fast light-field microscopy with event detection
The event detection technique has been introduced to light-field microscopy, boosting its imaging speed in orders of magnitude with simultaneous axial resolution enhancement in scattering medium.