Vindya Shetty, Shobith M. Shanbogh, P. Anjaneyulu, K. Deepak
{"title":"基于二氧化钛纳米片的存储器件中与顺从电流相关的多级电阻开关","authors":"Vindya Shetty, Shobith M. Shanbogh, P. Anjaneyulu, K. Deepak","doi":"10.1007/s10854-024-13777-w","DOIUrl":null,"url":null,"abstract":"<div><p>The rise of two-dimensional (2D) materials has unveiled numerous potentialities in future logic and memory devices. In this work, a resistive switching memory device based on 2D Titanium dioxide nanosheet (TiO<sub>2</sub> NS) is fabricated with a capacitor-like device structure in which TiO<sub>2</sub> NS is sandwiched between silver (Ag) and Fluorine-doped tin oxide (FTO) electrodes. The spin-coating method is used to coat the hydrothermally synthesized TiO<sub>2</sub> NS on the FTO substrate and then silver paint is used as top contact to complete the device Ag/TiO<sub>2</sub> NS/FTO. Here, TiO<sub>2</sub> NS based resistive switching device also called as memristor shows co-existence of bipolar and unipolar resistive switching depending on the voltage sweep direction. The device is suitable for memory applications as its ON/OFF current ratio is of the order 10<sup>2</sup>. The memory device shows 24 multiple resistive states (equivalent to 4.5 bits), which are obtained by tuning the compliance current from 0.2 to 4.8 mA. The multilevel resistive switching (RS) realized is attributed to the evolution and rupture of conductive filament in the TiO<sub>2</sub> NS. A retention test for multiple resistive states is conducted and it shows a stability up to 5 × 10<sup>3</sup> s. The device also showed good endurance for 5 × 10<sup>3</sup> cycles without any fluctuations in performance.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":"35 31","pages":""},"PeriodicalIF":2.8000,"publicationDate":"2024-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Compliance current dependent multilevel resistive switching in Titanium dioxide nanosheet based memory devices\",\"authors\":\"Vindya Shetty, Shobith M. Shanbogh, P. Anjaneyulu, K. Deepak\",\"doi\":\"10.1007/s10854-024-13777-w\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>The rise of two-dimensional (2D) materials has unveiled numerous potentialities in future logic and memory devices. In this work, a resistive switching memory device based on 2D Titanium dioxide nanosheet (TiO<sub>2</sub> NS) is fabricated with a capacitor-like device structure in which TiO<sub>2</sub> NS is sandwiched between silver (Ag) and Fluorine-doped tin oxide (FTO) electrodes. The spin-coating method is used to coat the hydrothermally synthesized TiO<sub>2</sub> NS on the FTO substrate and then silver paint is used as top contact to complete the device Ag/TiO<sub>2</sub> NS/FTO. Here, TiO<sub>2</sub> NS based resistive switching device also called as memristor shows co-existence of bipolar and unipolar resistive switching depending on the voltage sweep direction. The device is suitable for memory applications as its ON/OFF current ratio is of the order 10<sup>2</sup>. The memory device shows 24 multiple resistive states (equivalent to 4.5 bits), which are obtained by tuning the compliance current from 0.2 to 4.8 mA. The multilevel resistive switching (RS) realized is attributed to the evolution and rupture of conductive filament in the TiO<sub>2</sub> NS. A retention test for multiple resistive states is conducted and it shows a stability up to 5 × 10<sup>3</sup> s. The device also showed good endurance for 5 × 10<sup>3</sup> cycles without any fluctuations in performance.</p></div>\",\"PeriodicalId\":646,\"journal\":{\"name\":\"Journal of Materials Science: Materials in Electronics\",\"volume\":\"35 31\",\"pages\":\"\"},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2024-11-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Materials Science: Materials in Electronics\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s10854-024-13777-w\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-024-13777-w","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Compliance current dependent multilevel resistive switching in Titanium dioxide nanosheet based memory devices
The rise of two-dimensional (2D) materials has unveiled numerous potentialities in future logic and memory devices. In this work, a resistive switching memory device based on 2D Titanium dioxide nanosheet (TiO2 NS) is fabricated with a capacitor-like device structure in which TiO2 NS is sandwiched between silver (Ag) and Fluorine-doped tin oxide (FTO) electrodes. The spin-coating method is used to coat the hydrothermally synthesized TiO2 NS on the FTO substrate and then silver paint is used as top contact to complete the device Ag/TiO2 NS/FTO. Here, TiO2 NS based resistive switching device also called as memristor shows co-existence of bipolar and unipolar resistive switching depending on the voltage sweep direction. The device is suitable for memory applications as its ON/OFF current ratio is of the order 102. The memory device shows 24 multiple resistive states (equivalent to 4.5 bits), which are obtained by tuning the compliance current from 0.2 to 4.8 mA. The multilevel resistive switching (RS) realized is attributed to the evolution and rupture of conductive filament in the TiO2 NS. A retention test for multiple resistive states is conducted and it shows a stability up to 5 × 103 s. The device also showed good endurance for 5 × 103 cycles without any fluctuations in performance.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.