{"title":"基于单像素点展函数和深度学习的轴向密集发射器定位技术","authors":"Yihong Ji;Danni Chen;Hanzhe Wu;Gan Xiang;Heng Li;Bin Yu;Junle Qu","doi":"10.1109/JPHOT.2024.3476514","DOIUrl":null,"url":null,"abstract":"The point-by point 3D scanning strategy adopted in Stimulated Emission Depletion Microscopy (STED) is time-consuming. The 3D scanning can be replaced with a 2D scanning in the non-diffracting Bessel-Bessel STED (BB-STED). In order to extract the excited emitters’ axial information in BB-STED, we propose to encode axial information by using a detection optical path with single-helix PSF, and then predict the depths of the emitters with deep learning. Simulation demonstrated that, for dense emitters in a depth range of 4 µm, an axial precision of ∼35 nm can be achieved. Our method also works for experimental data, and an axial precision of ∼63 nm can be achieved.","PeriodicalId":13204,"journal":{"name":"IEEE Photonics Journal","volume":null,"pages":null},"PeriodicalIF":2.1000,"publicationDate":"2024-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10709644","citationCount":"0","resultStr":"{\"title\":\"Localizing Axial Dense Emitters Based on Single-Helix Point Spread Function and Deep Learning\",\"authors\":\"Yihong Ji;Danni Chen;Hanzhe Wu;Gan Xiang;Heng Li;Bin Yu;Junle Qu\",\"doi\":\"10.1109/JPHOT.2024.3476514\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The point-by point 3D scanning strategy adopted in Stimulated Emission Depletion Microscopy (STED) is time-consuming. The 3D scanning can be replaced with a 2D scanning in the non-diffracting Bessel-Bessel STED (BB-STED). In order to extract the excited emitters’ axial information in BB-STED, we propose to encode axial information by using a detection optical path with single-helix PSF, and then predict the depths of the emitters with deep learning. Simulation demonstrated that, for dense emitters in a depth range of 4 µm, an axial precision of ∼35 nm can be achieved. Our method also works for experimental data, and an axial precision of ∼63 nm can be achieved.\",\"PeriodicalId\":13204,\"journal\":{\"name\":\"IEEE Photonics Journal\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":2.1000,\"publicationDate\":\"2024-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10709644\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Photonics Journal\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10709644/\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Photonics Journal","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10709644/","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Localizing Axial Dense Emitters Based on Single-Helix Point Spread Function and Deep Learning
The point-by point 3D scanning strategy adopted in Stimulated Emission Depletion Microscopy (STED) is time-consuming. The 3D scanning can be replaced with a 2D scanning in the non-diffracting Bessel-Bessel STED (BB-STED). In order to extract the excited emitters’ axial information in BB-STED, we propose to encode axial information by using a detection optical path with single-helix PSF, and then predict the depths of the emitters with deep learning. Simulation demonstrated that, for dense emitters in a depth range of 4 µm, an axial precision of ∼35 nm can be achieved. Our method also works for experimental data, and an axial precision of ∼63 nm can be achieved.
期刊介绍:
Breakthroughs in the generation of light and in its control and utilization have given rise to the field of Photonics, a rapidly expanding area of science and technology with major technological and economic impact. Photonics integrates quantum electronics and optics to accelerate progress in the generation of novel photon sources and in their utilization in emerging applications at the micro and nano scales spanning from the far-infrared/THz to the x-ray region of the electromagnetic spectrum. IEEE Photonics Journal is an online-only journal dedicated to the rapid disclosure of top-quality peer-reviewed research at the forefront of all areas of photonics. Contributions addressing issues ranging from fundamental understanding to emerging technologies and applications are within the scope of the Journal. The Journal includes topics in: Photon sources from far infrared to X-rays, Photonics materials and engineered photonic structures, Integrated optics and optoelectronic, Ultrafast, attosecond, high field and short wavelength photonics, Biophotonics, including DNA photonics, Nanophotonics, Magnetophotonics, Fundamentals of light propagation and interaction; nonlinear effects, Optical data storage, Fiber optics and optical communications devices, systems, and technologies, Micro Opto Electro Mechanical Systems (MOEMS), Microwave photonics, Optical Sensors.