作者更正：电子设备中氧化膜的介电击穿

IF 79.8 1区材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY

Nature Reviews Materials Pub Date : 2024-10-30 DOI:10.1038/s41578-024-00752-4

Andrea Padovani, Paolo La Torraca, Jack Strand, Luca Larcher, Alexander L. Shluger

引用次数: 0

摘要

更正为Nature Reviews Materials https://doi.org/10.1038/s41578-024-00702-0，2024 年 8 月 7 日在线发表。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Author Correction: Dielectric breakdown of oxide films in electronic devices

Correction to: Nature Reviews Materials https://doi.org/10.1038/s41578-024-00702-0, published online 7 August 2024.

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来源期刊

Nature Reviews Materials Materials Science-Biomaterials

CiteScore

119.40

自引率

0.40%

发文量

107

期刊介绍： Nature Reviews Materials is an online-only journal that is published weekly. It covers a wide range of scientific disciplines within materials science. The journal includes Reviews, Perspectives, and Comments. Nature Reviews Materials focuses on various aspects of materials science, including the making, measuring, modelling, and manufacturing of materials. It examines the entire process of materials science, from laboratory discovery to the development of functional devices.