Feng Chen , Lanqing Mo , Fei Hu , Wangyun Li , Song Wei
{"title":"热迁移和电流应力对 Sn58Bi 焊料阻尼能力的协同效应","authors":"Feng Chen , Lanqing Mo , Fei Hu , Wangyun Li , Song Wei","doi":"10.1016/j.vacuum.2024.113760","DOIUrl":null,"url":null,"abstract":"<div><div>In order to evaluate the vibration resistance of Sn58Bi solder in serving electronic devices, the damping capacities of Sn58Bi solders after thermomigration (TM) test at a temperature gradient of 2000 °C/cm for different time (0, 120, 360, 720, and 1440 h) were characterized under electric current stressing (0, 4.0, and 8.0 A). The results indicate that the phase segregation of TM-tested Sn58Bi solders determines the damping performance of solders. The Bi-rich layer thickens with prolonged TM time and migrates in the direction from high temperature to low temperature. Both the critical strains (the values of dislocation getting rid of pining points) of strain-amplitude-related damping capacity curves increases with prolonged TM time, while decreases with increasing electric current. Moreover, both strain-amplitude-related and temperature-related damping capacity shows a general decreasing trend with prolonged TM time, while increases exponentially with increasing electric current. In addition, the damping mechanism changes from dislocation motion to phase boundary sliding with increasing temperature, and the transition temperature decreases with increasing current but generally increases with TM time.</div></div>","PeriodicalId":23559,"journal":{"name":"Vacuum","volume":"231 ","pages":"Article 113760"},"PeriodicalIF":3.8000,"publicationDate":"2024-10-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Synergistic effect of thermomigration and electric current stressing on damping capacity of Sn58Bi solder\",\"authors\":\"Feng Chen , Lanqing Mo , Fei Hu , Wangyun Li , Song Wei\",\"doi\":\"10.1016/j.vacuum.2024.113760\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>In order to evaluate the vibration resistance of Sn58Bi solder in serving electronic devices, the damping capacities of Sn58Bi solders after thermomigration (TM) test at a temperature gradient of 2000 °C/cm for different time (0, 120, 360, 720, and 1440 h) were characterized under electric current stressing (0, 4.0, and 8.0 A). The results indicate that the phase segregation of TM-tested Sn58Bi solders determines the damping performance of solders. The Bi-rich layer thickens with prolonged TM time and migrates in the direction from high temperature to low temperature. Both the critical strains (the values of dislocation getting rid of pining points) of strain-amplitude-related damping capacity curves increases with prolonged TM time, while decreases with increasing electric current. Moreover, both strain-amplitude-related and temperature-related damping capacity shows a general decreasing trend with prolonged TM time, while increases exponentially with increasing electric current. In addition, the damping mechanism changes from dislocation motion to phase boundary sliding with increasing temperature, and the transition temperature decreases with increasing current but generally increases with TM time.</div></div>\",\"PeriodicalId\":23559,\"journal\":{\"name\":\"Vacuum\",\"volume\":\"231 \",\"pages\":\"Article 113760\"},\"PeriodicalIF\":3.8000,\"publicationDate\":\"2024-10-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Vacuum\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0042207X24008066\",\"RegionNum\":2,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Vacuum","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0042207X24008066","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
Synergistic effect of thermomigration and electric current stressing on damping capacity of Sn58Bi solder
In order to evaluate the vibration resistance of Sn58Bi solder in serving electronic devices, the damping capacities of Sn58Bi solders after thermomigration (TM) test at a temperature gradient of 2000 °C/cm for different time (0, 120, 360, 720, and 1440 h) were characterized under electric current stressing (0, 4.0, and 8.0 A). The results indicate that the phase segregation of TM-tested Sn58Bi solders determines the damping performance of solders. The Bi-rich layer thickens with prolonged TM time and migrates in the direction from high temperature to low temperature. Both the critical strains (the values of dislocation getting rid of pining points) of strain-amplitude-related damping capacity curves increases with prolonged TM time, while decreases with increasing electric current. Moreover, both strain-amplitude-related and temperature-related damping capacity shows a general decreasing trend with prolonged TM time, while increases exponentially with increasing electric current. In addition, the damping mechanism changes from dislocation motion to phase boundary sliding with increasing temperature, and the transition temperature decreases with increasing current but generally increases with TM time.
期刊介绍:
Vacuum is an international rapid publications journal with a focus on short communication. All papers are peer-reviewed, with the review process for short communication geared towards very fast turnaround times. The journal also published full research papers, thematic issues and selected papers from leading conferences.
A report in Vacuum should represent a major advance in an area that involves a controlled environment at pressures of one atmosphere or below.
The scope of the journal includes:
1. Vacuum; original developments in vacuum pumping and instrumentation, vacuum measurement, vacuum gas dynamics, gas-surface interactions, surface treatment for UHV applications and low outgassing, vacuum melting, sintering, and vacuum metrology. Technology and solutions for large-scale facilities (e.g., particle accelerators and fusion devices). New instrumentation ( e.g., detectors and electron microscopes).
2. Plasma science; advances in PVD, CVD, plasma-assisted CVD, ion sources, deposition processes and analysis.
3. Surface science; surface engineering, surface chemistry, surface analysis, crystal growth, ion-surface interactions and etching, nanometer-scale processing, surface modification.
4. Materials science; novel functional or structural materials. Metals, ceramics, and polymers. Experiments, simulations, and modelling for understanding structure-property relationships. Thin films and coatings. Nanostructures and ion implantation.