Unraveling dynamic recrystallization mechanisms in Ni-based wrought superalloy GH4698 through comprehensive EBSD analysis
A comprehensive examination of dynamic recrystallization (DRX) mechanisms in wrought superalloy GH4698 has been conducted, leveraging Gleeble thermal simulation experiments and advanced Electron Backscatter Diffraction (EBSD) characterization techniques. Rigorous analysis elucidates four distinct recrystallization processes: Discontinuous Dynamic Recrystallization (DDRX), instigated by strain-induced boundary migration (SIBM); Continuous Dynamic Recrystallization (CDRX), characterized by progressive lattice rotation; Particle Stimulated Nucleation (PSN), driven by the Zener pinning effect of MC-type carbides; and Twin-induced Dynamic Recrystallization (TDRX), facilitated by the interaction between twin boundaries and existing dislocations.
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