Zheyi Yao;Zhentao Song;Guohua Gu;Qian Chen;Shenghang Zhou;Xiubao Sui
{"title":"通过反射估计识别基于紧凑型 OFDR 系统的光纤","authors":"Zheyi Yao;Zhentao Song;Guohua Gu;Qian Chen;Shenghang Zhou;Xiubao Sui","doi":"10.1109/TIM.2024.3413156","DOIUrl":null,"url":null,"abstract":"This article reports an effective, robust, and universal estimating method to enhance and maintain the measuring accuracy for the semiconductor laser (SCL)-based optical frequency-domain reflectometry (OFDR) by estimating the reflecting locations. The core is to build the bridge between the limited data sampling rate and almost continued real values, providing the potential strategy for high-resolution fiber sensing without the modulated optical fibers. The experiments demonstrate that the described method can be effectively applied to a range of applicating areas, resulting in the millimeter-level optical fiber subset identifying with an error equal rate (EER) of less than 1%.","PeriodicalId":13341,"journal":{"name":"IEEE Transactions on Instrumentation and Measurement","volume":null,"pages":null},"PeriodicalIF":5.6000,"publicationDate":"2024-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Identifying the Optical Fiber Based on the Compact OFDR System via Reflecting Estimation\",\"authors\":\"Zheyi Yao;Zhentao Song;Guohua Gu;Qian Chen;Shenghang Zhou;Xiubao Sui\",\"doi\":\"10.1109/TIM.2024.3413156\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article reports an effective, robust, and universal estimating method to enhance and maintain the measuring accuracy for the semiconductor laser (SCL)-based optical frequency-domain reflectometry (OFDR) by estimating the reflecting locations. The core is to build the bridge between the limited data sampling rate and almost continued real values, providing the potential strategy for high-resolution fiber sensing without the modulated optical fibers. The experiments demonstrate that the described method can be effectively applied to a range of applicating areas, resulting in the millimeter-level optical fiber subset identifying with an error equal rate (EER) of less than 1%.\",\"PeriodicalId\":13341,\"journal\":{\"name\":\"IEEE Transactions on Instrumentation and Measurement\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":5.6000,\"publicationDate\":\"2024-10-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Instrumentation and Measurement\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10735790/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Instrumentation and Measurement","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10735790/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Identifying the Optical Fiber Based on the Compact OFDR System via Reflecting Estimation
This article reports an effective, robust, and universal estimating method to enhance and maintain the measuring accuracy for the semiconductor laser (SCL)-based optical frequency-domain reflectometry (OFDR) by estimating the reflecting locations. The core is to build the bridge between the limited data sampling rate and almost continued real values, providing the potential strategy for high-resolution fiber sensing without the modulated optical fibers. The experiments demonstrate that the described method can be effectively applied to a range of applicating areas, resulting in the millimeter-level optical fiber subset identifying with an error equal rate (EER) of less than 1%.
期刊介绍:
Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.