CIGS 太阳能电池的光伏性能:使用掺镁和掺铝氧化锌薄膜层替代 TCO 和前接触层的影响

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Mehmet Fatih Gozukizil, Enes Nayman, Sinan Temel, Fatma Ozge Gokmen
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引用次数: 0

摘要

在本研究中,我们旨在通过掺杂不同比例的铝和镁来改善基于氧化锌的层状 CIGS 太阳能电池的电气、光学和结构特性。采用溶胶-凝胶旋涂技术制备了掺铝氧化锌和掺镁氧化锌薄膜。两种材料的掺杂率分别为 1%、3% 和 5%。使用 XRD、FESEM、AFM 和 UV-Vis 光谱分析了结构、表面和光学特性。结果表明,铝的掺杂增加了表面粗糙度,而镁的掺杂降低了表面粗糙度。铝的掺杂使带隙减小到 3.05 eV,从而提高了导电性,而镁的掺杂则使带隙增大到 3.52 eV,从而提高了光学透明度。与未掺杂 ZnO 层的 23.24% 相比,AZ5/MZ1 层的理想组合使 CIGS 太阳能电池的效率显著提高了 26.46%。此外,AZ5 的表面粗糙度值为 224.3 nm,MZ5 的表面粗糙度值为 69.7 nm。这项研究证明了铝和镁共掺杂氧化锌薄膜在提高太阳能电池和其他光电设备性能方面的潜力,为可再生能源技术带来了广阔的发展前景。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Photovoltaic performance in CIGS solar cells: effects of using Mg- and Al-doped ZnO thin-film layers as alternative TCO and front contact layer

In this study, we aimed to improve the electrical, optical, and structural properties of ZnO-based layered CIGS solar cells by doping different ratios of Al and Mg. Al-doped ZnO and Mg-doped ZnO thin films were prepared using sol–gel spin-coating technique. The doping rates were 1%, 3%, and 5% for both materials. Structural, surface, and optical properties were analyzed using XRD, FESEM, AFM, and UV–Vis spectroscopy. The results revealed that Al doping increased surface roughness, while Mg doping decreased it. Al doping reduced the band gap to 3.05 eV, enhancing conductivity, whereas Mg doping increased the band gap to 3.52 eV, improving optical transparency. The ideal combination of AZ5/MZ1 layers achieved a significant efficiency increase of 26.46% in CIGS solar cells, compared to 23.24% with undoped ZnO layers. Additionally, the surface roughness values were found to be 224.3 nm for AZ5 and 69.7 nm for MZ5. This study demonstrates the potential of Al and Mg-co-doped ZnO thin films to improve the performance of solar cells and other optoelectronic devices, offering promising developments in renewable energy technologies.

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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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