Abla Kamilia Madkour, Fatiha Rogti, Linda Aissani, Ahmed Hamdi, Ahlam Belgroune, Abdelhalim Zoukel
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The energy dispersive spectroscopy (EDS) revealed a decrease in the S content and an under-stoichiometric composition of CdS film at 400 °C. The band gap value decreased from 2.47 to 2.24 eV as the annealing temperature increased, while optimum transmittance was obtained at 120 °C. Mott–Schottky analysis revealed n-type conductivity for both samples where the flat band potential and donor density vary with the annealing temperature from − 0.99 to − 1.02 V and from 3.9 × 10<sup>20</sup> to 1.1 × 10<sup>21</sup> cm<sup>−3</sup>, respectively. The electrochemical impedance studies affirmed that the electrochemical process is under kinetic control and demonstrated lower <i>R</i><sub>CT</sub> at 400 °C. PEC measurements showed enhancement in the <i>V</i><sub>OC</sub> and <i>J</i><sub>SC</sub> at 400 °C, indicating improved sensitivity and efficiency for photodetection. The slow decay of dark and photocurrent was attributed to defects and local potential fluctuations within the films. These findings highlight the effectiveness of using oxalic acid in the deposition process of CdS thin films making them suitable for solar cell applications.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":null,"pages":null},"PeriodicalIF":2.8000,"publicationDate":"2024-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://link.springer.com/content/pdf/10.1007/s10854-024-13751-6.pdf","citationCount":"0","resultStr":"{\"title\":\"Effect of annealing treatment on oxalic acid-assisted electrodeposited CdS thin films for enhanced solar cell performance\",\"authors\":\"Abla Kamilia Madkour, Fatiha Rogti, Linda Aissani, Ahmed Hamdi, Ahlam Belgroune, Abdelhalim Zoukel\",\"doi\":\"10.1007/s10854-024-13751-6\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>CdS thin films have been successfully electrodeposited by introducing oxalic acid in the electrolytic solution as a novel complexing agent to prevent sulfide precipitation. The CdS films were grown on an FTO/glass substrate at − 0.890 V for 10 min and then annealed at 120 °C and 400 °C, respectively, in air. X-ray diffraction revealed that the CdS films have mixed hexagonal and cubic phases with (311) cubic-CdS preferred orientation. Scanning electron microscopy (SEM) results illustrated a transition from compact grains with more spherical precipitations on the surface at 120 °C to denser and homogeneous structure with a large crystallite size at 400 °C. The energy dispersive spectroscopy (EDS) revealed a decrease in the S content and an under-stoichiometric composition of CdS film at 400 °C. The band gap value decreased from 2.47 to 2.24 eV as the annealing temperature increased, while optimum transmittance was obtained at 120 °C. Mott–Schottky analysis revealed n-type conductivity for both samples where the flat band potential and donor density vary with the annealing temperature from − 0.99 to − 1.02 V and from 3.9 × 10<sup>20</sup> to 1.1 × 10<sup>21</sup> cm<sup>−3</sup>, respectively. The electrochemical impedance studies affirmed that the electrochemical process is under kinetic control and demonstrated lower <i>R</i><sub>CT</sub> at 400 °C. PEC measurements showed enhancement in the <i>V</i><sub>OC</sub> and <i>J</i><sub>SC</sub> at 400 °C, indicating improved sensitivity and efficiency for photodetection. The slow decay of dark and photocurrent was attributed to defects and local potential fluctuations within the films. 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引用次数: 0
摘要
通过在电解溶液中引入草酸作为防止硫化物沉淀的新型络合剂,成功电沉积出了 CdS 薄膜。CdS 薄膜在 - 0.890 V 下于 FTO/ 玻璃基底上生长 10 分钟,然后分别在 120 °C 和 400 °C 的空气中退火。X 射线衍射显示,CdS 薄膜具有六方和立方混合相,(311) 立方-CdS 优先取向。扫描电子显微镜(SEM)结果表明,在 120 ℃ 时,晶粒紧密,表面有较多球形沉淀,而在 400 ℃ 时,晶粒更加致密,结构更加均匀,晶粒尺寸较大。能量色散光谱(EDS)显示,在 400 ℃ 时,CdS 薄膜的 S 含量下降,并出现了化学计量不足的现象。随着退火温度的升高,带隙值从 2.47 eV 降至 2.24 eV,而最佳透射率则在 120 °C 时达到。莫特-肖特基分析表明,这两种样品都具有 n 型导电性,其平带电位和供体密度随退火温度的变化而变化,分别从 - 0.99 V 到 - 1.02 V,以及从 3.9 × 1020 到 1.1 × 1021 cm-3。电化学阻抗研究证实了电化学过程是在动力学控制下进行的,并表明在 400 °C 时 RCT 较低。PEC 测量显示,400 ℃ 时 VOC 和 JSC 有所提高,这表明光检测的灵敏度和效率有所提高。暗电流和光电流的缓慢衰减归因于薄膜内部的缺陷和局部电位波动。这些发现凸显了在 CdS 薄膜沉积过程中使用草酸的有效性,使其适用于太阳能电池应用。
Effect of annealing treatment on oxalic acid-assisted electrodeposited CdS thin films for enhanced solar cell performance
CdS thin films have been successfully electrodeposited by introducing oxalic acid in the electrolytic solution as a novel complexing agent to prevent sulfide precipitation. The CdS films were grown on an FTO/glass substrate at − 0.890 V for 10 min and then annealed at 120 °C and 400 °C, respectively, in air. X-ray diffraction revealed that the CdS films have mixed hexagonal and cubic phases with (311) cubic-CdS preferred orientation. Scanning electron microscopy (SEM) results illustrated a transition from compact grains with more spherical precipitations on the surface at 120 °C to denser and homogeneous structure with a large crystallite size at 400 °C. The energy dispersive spectroscopy (EDS) revealed a decrease in the S content and an under-stoichiometric composition of CdS film at 400 °C. The band gap value decreased from 2.47 to 2.24 eV as the annealing temperature increased, while optimum transmittance was obtained at 120 °C. Mott–Schottky analysis revealed n-type conductivity for both samples where the flat band potential and donor density vary with the annealing temperature from − 0.99 to − 1.02 V and from 3.9 × 1020 to 1.1 × 1021 cm−3, respectively. The electrochemical impedance studies affirmed that the electrochemical process is under kinetic control and demonstrated lower RCT at 400 °C. PEC measurements showed enhancement in the VOC and JSC at 400 °C, indicating improved sensitivity and efficiency for photodetection. The slow decay of dark and photocurrent was attributed to defects and local potential fluctuations within the films. These findings highlight the effectiveness of using oxalic acid in the deposition process of CdS thin films making them suitable for solar cell applications.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.