{"title":"基于多照明模式和多任务学习算法的大孔径光学表面弱特征微瑕疵快速检测系统","authors":"Zhaoyang Yin;Linjie Zhao;Jian Cheng;Henan Liu;Mingjun Chen","doi":"10.1109/TIM.2024.3472831","DOIUrl":null,"url":null,"abstract":"The occurrence of surface damage and contaminants can shorten the service life of large-aperture optics in high-power laser facilities, and efficient and accurate inspection of these flaws is an integral part of facility maintenance. Achieving rapid inspection of micrometer-level flaws (\n<inline-formula> <tex-math>$\\gt 20~\\mu $ </tex-math></inline-formula>\nm) on large-aperture optics surface (\n<inline-formula> <tex-math>$430\\times 430$ </tex-math></inline-formula>\n mm) is a great challenge for both imaging systems and detection algorithms. To solve this problem, a rapid inspection system based on multi-illumination system and dark-field imaging principle is designed, which can complete full-aperture inspection of front and back surface of optics at one time through single-frame imaging and image processing. The application of multi-illumination modes increases the differentiation between different categories of weak feature flaws and provides sufficient information for flaw classification and measurement. A multitask deep learning (DL) framework that joints flaw classification and size regression is also designed to improve the classification capability and size measurement precision of the system for micro-flaws. The experimental results show that the system can perform a fast inspection of optics at a rate of less than 1.5 min per piece. The classification accuracy for four categories of flaws is 98.5% and the mean relative error (MRE) of size measurement is 14.8%. In the range of 20–\n<inline-formula> <tex-math>$150~\\mu $ </tex-math></inline-formula>\nm, exceeding the resolution limit of the imaging system, the detection system still maintains a high accuracy (98.9%) and low measurement error (15.6%). The proposed inspection system and the method for large-aperture optics achieve rapid detection of weak feature micro-flaws, which provides a highly promising solution for rapid, accurate, and low-cost inspection of precision optics.","PeriodicalId":13341,"journal":{"name":"IEEE Transactions on Instrumentation and Measurement","volume":"73 ","pages":"1-15"},"PeriodicalIF":5.6000,"publicationDate":"2024-10-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Rapid Inspection System for Weak Feature Micro-Flaw on Large-Aperture Optics Surface Based on Multi-Illumination Modes and Multitask Learning Algorithms\",\"authors\":\"Zhaoyang Yin;Linjie Zhao;Jian Cheng;Henan Liu;Mingjun Chen\",\"doi\":\"10.1109/TIM.2024.3472831\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The occurrence of surface damage and contaminants can shorten the service life of large-aperture optics in high-power laser facilities, and efficient and accurate inspection of these flaws is an integral part of facility maintenance. Achieving rapid inspection of micrometer-level flaws (\\n<inline-formula> <tex-math>$\\\\gt 20~\\\\mu $ </tex-math></inline-formula>\\nm) on large-aperture optics surface (\\n<inline-formula> <tex-math>$430\\\\times 430$ </tex-math></inline-formula>\\n mm) is a great challenge for both imaging systems and detection algorithms. To solve this problem, a rapid inspection system based on multi-illumination system and dark-field imaging principle is designed, which can complete full-aperture inspection of front and back surface of optics at one time through single-frame imaging and image processing. The application of multi-illumination modes increases the differentiation between different categories of weak feature flaws and provides sufficient information for flaw classification and measurement. A multitask deep learning (DL) framework that joints flaw classification and size regression is also designed to improve the classification capability and size measurement precision of the system for micro-flaws. The experimental results show that the system can perform a fast inspection of optics at a rate of less than 1.5 min per piece. The classification accuracy for four categories of flaws is 98.5% and the mean relative error (MRE) of size measurement is 14.8%. In the range of 20–\\n<inline-formula> <tex-math>$150~\\\\mu $ </tex-math></inline-formula>\\nm, exceeding the resolution limit of the imaging system, the detection system still maintains a high accuracy (98.9%) and low measurement error (15.6%). The proposed inspection system and the method for large-aperture optics achieve rapid detection of weak feature micro-flaws, which provides a highly promising solution for rapid, accurate, and low-cost inspection of precision optics.\",\"PeriodicalId\":13341,\"journal\":{\"name\":\"IEEE Transactions on Instrumentation and Measurement\",\"volume\":\"73 \",\"pages\":\"1-15\"},\"PeriodicalIF\":5.6000,\"publicationDate\":\"2024-10-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Instrumentation and Measurement\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10719605/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Instrumentation and Measurement","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10719605/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Rapid Inspection System for Weak Feature Micro-Flaw on Large-Aperture Optics Surface Based on Multi-Illumination Modes and Multitask Learning Algorithms
The occurrence of surface damage and contaminants can shorten the service life of large-aperture optics in high-power laser facilities, and efficient and accurate inspection of these flaws is an integral part of facility maintenance. Achieving rapid inspection of micrometer-level flaws (
$\gt 20~\mu $
m) on large-aperture optics surface (
$430\times 430$
mm) is a great challenge for both imaging systems and detection algorithms. To solve this problem, a rapid inspection system based on multi-illumination system and dark-field imaging principle is designed, which can complete full-aperture inspection of front and back surface of optics at one time through single-frame imaging and image processing. The application of multi-illumination modes increases the differentiation between different categories of weak feature flaws and provides sufficient information for flaw classification and measurement. A multitask deep learning (DL) framework that joints flaw classification and size regression is also designed to improve the classification capability and size measurement precision of the system for micro-flaws. The experimental results show that the system can perform a fast inspection of optics at a rate of less than 1.5 min per piece. The classification accuracy for four categories of flaws is 98.5% and the mean relative error (MRE) of size measurement is 14.8%. In the range of 20–
$150~\mu $
m, exceeding the resolution limit of the imaging system, the detection system still maintains a high accuracy (98.9%) and low measurement error (15.6%). The proposed inspection system and the method for large-aperture optics achieve rapid detection of weak feature micro-flaws, which provides a highly promising solution for rapid, accurate, and low-cost inspection of precision optics.
期刊介绍:
Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.