Jaewook Oh;Inhwan Kim;Inhyeok Hwang;Bowook Choi;Namsu Kim
{"title":"使用逆变器输出参数的绝缘栅双极晶体管可编程在线键合线故障检测和定位方法","authors":"Jaewook Oh;Inhwan Kim;Inhyeok Hwang;Bowook Choi;Namsu Kim","doi":"10.1109/TIM.2024.3472910","DOIUrl":null,"url":null,"abstract":"Prognostics and health monitoring of insulated gate bipolar transistors (IGBTs) is a primary concern when determining the reliability of inverter systems. The rising popularity of electric vehicles (EVs) has increased the investigations on the reliability of power modules, particularly that of IGBTs. Condition monitoring of IGBT can be performed using various IGBT characteristic parameters, such as collector-emitter saturation voltage (\n<inline-formula> <tex-math>${V} _{\\text {ce,sat}}$ </tex-math></inline-formula>\n), collector current (\n<inline-formula> <tex-math>${I} _{\\text {C}}$ </tex-math></inline-formula>\n), and gate-emitter threshold voltage (\n<inline-formula> <tex-math>${V} _{\\text {ge,th}}$ </tex-math></inline-formula>\n). This study proposes a programmable method for detecting and pinpointing the location of bond-wire lift-off without accessing the gate signal or the collector and emitter terminals of the targeted IGBT chip or freewheeling diode (FWD). The methodology of collecting and processing the collector-emitter voltage data from the three-phase motor phase terminal voltage is discussed. The proposed approach is validated through simulations of a motor drive system, and its adaptability and sensitivity are confirmed through fault emulation tests and power cycling tests in actual motor drive systems.","PeriodicalId":13341,"journal":{"name":"IEEE Transactions on Instrumentation and Measurement","volume":null,"pages":null},"PeriodicalIF":5.6000,"publicationDate":"2024-10-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Programmable Online Bond-Wire Fault Detection and Location Method for Insulated Gate Bipolar Transistor Using Inverter Output Parameters\",\"authors\":\"Jaewook Oh;Inhwan Kim;Inhyeok Hwang;Bowook Choi;Namsu Kim\",\"doi\":\"10.1109/TIM.2024.3472910\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Prognostics and health monitoring of insulated gate bipolar transistors (IGBTs) is a primary concern when determining the reliability of inverter systems. The rising popularity of electric vehicles (EVs) has increased the investigations on the reliability of power modules, particularly that of IGBTs. Condition monitoring of IGBT can be performed using various IGBT characteristic parameters, such as collector-emitter saturation voltage (\\n<inline-formula> <tex-math>${V} _{\\\\text {ce,sat}}$ </tex-math></inline-formula>\\n), collector current (\\n<inline-formula> <tex-math>${I} _{\\\\text {C}}$ </tex-math></inline-formula>\\n), and gate-emitter threshold voltage (\\n<inline-formula> <tex-math>${V} _{\\\\text {ge,th}}$ </tex-math></inline-formula>\\n). This study proposes a programmable method for detecting and pinpointing the location of bond-wire lift-off without accessing the gate signal or the collector and emitter terminals of the targeted IGBT chip or freewheeling diode (FWD). The methodology of collecting and processing the collector-emitter voltage data from the three-phase motor phase terminal voltage is discussed. The proposed approach is validated through simulations of a motor drive system, and its adaptability and sensitivity are confirmed through fault emulation tests and power cycling tests in actual motor drive systems.\",\"PeriodicalId\":13341,\"journal\":{\"name\":\"IEEE Transactions on Instrumentation and Measurement\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":5.6000,\"publicationDate\":\"2024-10-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Instrumentation and Measurement\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10726721/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Instrumentation and Measurement","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10726721/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Programmable Online Bond-Wire Fault Detection and Location Method for Insulated Gate Bipolar Transistor Using Inverter Output Parameters
Prognostics and health monitoring of insulated gate bipolar transistors (IGBTs) is a primary concern when determining the reliability of inverter systems. The rising popularity of electric vehicles (EVs) has increased the investigations on the reliability of power modules, particularly that of IGBTs. Condition monitoring of IGBT can be performed using various IGBT characteristic parameters, such as collector-emitter saturation voltage (
${V} _{\text {ce,sat}}$
), collector current (
${I} _{\text {C}}$
), and gate-emitter threshold voltage (
${V} _{\text {ge,th}}$
). This study proposes a programmable method for detecting and pinpointing the location of bond-wire lift-off without accessing the gate signal or the collector and emitter terminals of the targeted IGBT chip or freewheeling diode (FWD). The methodology of collecting and processing the collector-emitter voltage data from the three-phase motor phase terminal voltage is discussed. The proposed approach is validated through simulations of a motor drive system, and its adaptability and sensitivity are confirmed through fault emulation tests and power cycling tests in actual motor drive systems.
期刊介绍:
Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.