James S. Sharp, Nathaniel M. Roberts and Sam Walker
{"title":"溶剂膨胀弹性体薄膜中电话线水泡的形成。","authors":"James S. Sharp, Nathaniel M. Roberts and Sam Walker","doi":"10.1039/D4SM01035C","DOIUrl":null,"url":null,"abstract":"<p >Video imaging was used to study large-slope folded telephone cord blister formation in solvent swollen films of polydimethylsiloxane (PDMS) elastomers. Chlorobenzene, chloroform, heptane and toluene were used to swell PDMS films with thickness values in the range 15 μm < <em>h</em> < 223 μm supported on glass substrates. Measurements of the blister width, corrugation wavelength and blister growth speed were studied as a function of the film thickness for all four solvents. Modified theories of buckling were shown to accurately predict the film thickness dependence of the width and corrugation wavelength and a modified fracture mechanics approach was shown to reproduce the non-monotonic thickness dependence of the blister growth rates. Two critical thickness values were identified for telephone cord blisters formed on solvent swollen PDMS films-one corresponding to a lower critical thickness for blistering and the other corresponding to a peak in the thickness dependent blister growth rates. Blister formation is shown to be consistent with the existence of mixed modality in the growth of the crack tip at the film–substrate interface. Both critical thickness values are shown to depend upon the strength of the adhesive interactions between the film and the substrate and the Young's modulus of the films. A simple method of patterning surfaces with telephone cord blisters is also introduced.</p>","PeriodicalId":103,"journal":{"name":"Soft Matter","volume":" 44","pages":" 8812-8823"},"PeriodicalIF":2.9000,"publicationDate":"2024-10-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://pubs.rsc.org/en/content/articlepdf/2024/sm/d4sm01035c?page=search","citationCount":"0","resultStr":"{\"title\":\"Telephone cord blister formation in solvent swollen elastomer films†\",\"authors\":\"James S. Sharp, Nathaniel M. Roberts and Sam Walker\",\"doi\":\"10.1039/D4SM01035C\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p >Video imaging was used to study large-slope folded telephone cord blister formation in solvent swollen films of polydimethylsiloxane (PDMS) elastomers. Chlorobenzene, chloroform, heptane and toluene were used to swell PDMS films with thickness values in the range 15 μm < <em>h</em> < 223 μm supported on glass substrates. Measurements of the blister width, corrugation wavelength and blister growth speed were studied as a function of the film thickness for all four solvents. Modified theories of buckling were shown to accurately predict the film thickness dependence of the width and corrugation wavelength and a modified fracture mechanics approach was shown to reproduce the non-monotonic thickness dependence of the blister growth rates. Two critical thickness values were identified for telephone cord blisters formed on solvent swollen PDMS films-one corresponding to a lower critical thickness for blistering and the other corresponding to a peak in the thickness dependent blister growth rates. Blister formation is shown to be consistent with the existence of mixed modality in the growth of the crack tip at the film–substrate interface. Both critical thickness values are shown to depend upon the strength of the adhesive interactions between the film and the substrate and the Young's modulus of the films. A simple method of patterning surfaces with telephone cord blisters is also introduced.</p>\",\"PeriodicalId\":103,\"journal\":{\"name\":\"Soft Matter\",\"volume\":\" 44\",\"pages\":\" 8812-8823\"},\"PeriodicalIF\":2.9000,\"publicationDate\":\"2024-10-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://pubs.rsc.org/en/content/articlepdf/2024/sm/d4sm01035c?page=search\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Soft Matter\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://pubs.rsc.org/en/content/articlelanding/2024/sm/d4sm01035c\",\"RegionNum\":3,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"CHEMISTRY, PHYSICAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Soft Matter","FirstCategoryId":"92","ListUrlMain":"https://pubs.rsc.org/en/content/articlelanding/2024/sm/d4sm01035c","RegionNum":3,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
Telephone cord blister formation in solvent swollen elastomer films†
Video imaging was used to study large-slope folded telephone cord blister formation in solvent swollen films of polydimethylsiloxane (PDMS) elastomers. Chlorobenzene, chloroform, heptane and toluene were used to swell PDMS films with thickness values in the range 15 μm < h < 223 μm supported on glass substrates. Measurements of the blister width, corrugation wavelength and blister growth speed were studied as a function of the film thickness for all four solvents. Modified theories of buckling were shown to accurately predict the film thickness dependence of the width and corrugation wavelength and a modified fracture mechanics approach was shown to reproduce the non-monotonic thickness dependence of the blister growth rates. Two critical thickness values were identified for telephone cord blisters formed on solvent swollen PDMS films-one corresponding to a lower critical thickness for blistering and the other corresponding to a peak in the thickness dependent blister growth rates. Blister formation is shown to be consistent with the existence of mixed modality in the growth of the crack tip at the film–substrate interface. Both critical thickness values are shown to depend upon the strength of the adhesive interactions between the film and the substrate and the Young's modulus of the films. A simple method of patterning surfaces with telephone cord blisters is also introduced.