基于伪标记的半监督学习用于高带宽存储器 (HBM) 中间件的信号完整性分析

IF 2 3区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Chang-Sheng Mao;Da-Wei Wang;Wen-Sheng Zhao;Yue Hu
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引用次数: 0

摘要

本文提出了一种基于伪标记(PL)的半监督学习方法来识别眼图失真,以准确定位高带宽存储(HBM)硅中间通道的信号完整性(SI)问题。首先,提出了影响眼图的四个主要因素,并考虑了12种不同的眼图畸变。通过训练卷积神经网络(CNN)和四种不同的模型来识别这些眼图扭曲,并证明了所提出的CNN具有良好的性能。然后,应用PL方法进一步提高模型性能。最后,本文提出的CNN与PL方法相结合,准确率达到97.5%,比LeNet提高了32.3%。同时,该模型的图形处理单元内存占用比AlexNet少39.2%。该方法为快速准确定位HBM中介器的SI问题源提供了有效途径。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Pseudo-Labeling Based Semi-Supervised Learning for Signal Integrity Analysis of High-Bandwidth Memory (HBM) Interposer
In this article, a pseudolabeling (PL) based semisupervised learning method is proposed to identify the eye diagram distortion for accurately locating the signal integrity (SI) problems of high-bandwidth memory (HBM) silicon interposer channels. First, four main factors influencing the eye diagrams are presented, and 12 different eye diagram distortions are considered. The proposed convolutional neural network (CNN) and four different models are trained to identify these eye diagram distortions, and it is demonstrated that the proposed CNN exhibits good performance. Then, the PL method is applied to further improve the model performance. Finally, with the combination of the proposed CNN and PL method, the accuracy reaches up to 97.5% and becomes 32.3% higher than LeNet. Simultaneously, the graphic processing unit memory usage of the proposed model is 39.2% less than that of AlexNet. The proposed method provides an effective way for fast and accurately localizing the source of the SI problems for HBM interposer.
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来源期刊
CiteScore
4.80
自引率
19.00%
发文量
235
审稿时长
2.3 months
期刊介绍: IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.
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