{"title":"基于伪标记的半监督学习用于高带宽存储器 (HBM) 中间件的信号完整性分析","authors":"Chang-Sheng Mao;Da-Wei Wang;Wen-Sheng Zhao;Yue Hu","doi":"10.1109/TEMC.2024.3474431","DOIUrl":null,"url":null,"abstract":"In this article, a pseudolabeling (PL) based semisupervised learning method is proposed to identify the eye diagram distortion for accurately locating the signal integrity (SI) problems of high-bandwidth memory (HBM) silicon interposer channels. First, four main factors influencing the eye diagrams are presented, and 12 different eye diagram distortions are considered. The proposed convolutional neural network (CNN) and four different models are trained to identify these eye diagram distortions, and it is demonstrated that the proposed CNN exhibits good performance. Then, the PL method is applied to further improve the model performance. Finally, with the combination of the proposed CNN and PL method, the accuracy reaches up to 97.5% and becomes 32.3% higher than LeNet. Simultaneously, the graphic processing unit memory usage of the proposed model is 39.2% less than that of AlexNet. The proposed method provides an effective way for fast and accurately localizing the source of the SI problems for HBM interposer.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"66 6","pages":"2056-2064"},"PeriodicalIF":2.0000,"publicationDate":"2024-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Pseudo-Labeling Based Semi-Supervised Learning for Signal Integrity Analysis of High-Bandwidth Memory (HBM) Interposer\",\"authors\":\"Chang-Sheng Mao;Da-Wei Wang;Wen-Sheng Zhao;Yue Hu\",\"doi\":\"10.1109/TEMC.2024.3474431\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this article, a pseudolabeling (PL) based semisupervised learning method is proposed to identify the eye diagram distortion for accurately locating the signal integrity (SI) problems of high-bandwidth memory (HBM) silicon interposer channels. First, four main factors influencing the eye diagrams are presented, and 12 different eye diagram distortions are considered. The proposed convolutional neural network (CNN) and four different models are trained to identify these eye diagram distortions, and it is demonstrated that the proposed CNN exhibits good performance. Then, the PL method is applied to further improve the model performance. Finally, with the combination of the proposed CNN and PL method, the accuracy reaches up to 97.5% and becomes 32.3% higher than LeNet. Simultaneously, the graphic processing unit memory usage of the proposed model is 39.2% less than that of AlexNet. The proposed method provides an effective way for fast and accurately localizing the source of the SI problems for HBM interposer.\",\"PeriodicalId\":55012,\"journal\":{\"name\":\"IEEE Transactions on Electromagnetic Compatibility\",\"volume\":\"66 6\",\"pages\":\"2056-2064\"},\"PeriodicalIF\":2.0000,\"publicationDate\":\"2024-10-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Electromagnetic Compatibility\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10716254/\",\"RegionNum\":3,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electromagnetic Compatibility","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10716254/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Pseudo-Labeling Based Semi-Supervised Learning for Signal Integrity Analysis of High-Bandwidth Memory (HBM) Interposer
In this article, a pseudolabeling (PL) based semisupervised learning method is proposed to identify the eye diagram distortion for accurately locating the signal integrity (SI) problems of high-bandwidth memory (HBM) silicon interposer channels. First, four main factors influencing the eye diagrams are presented, and 12 different eye diagram distortions are considered. The proposed convolutional neural network (CNN) and four different models are trained to identify these eye diagram distortions, and it is demonstrated that the proposed CNN exhibits good performance. Then, the PL method is applied to further improve the model performance. Finally, with the combination of the proposed CNN and PL method, the accuracy reaches up to 97.5% and becomes 32.3% higher than LeNet. Simultaneously, the graphic processing unit memory usage of the proposed model is 39.2% less than that of AlexNet. The proposed method provides an effective way for fast and accurately localizing the source of the SI problems for HBM interposer.
期刊介绍:
IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.