{"title":"具有数字消除 DAC 错误功能的 90 美元-dBFS-IM$_{3}$、164 美元-dBFS/Hz-NSD、700 兆赫带宽连续时间流水线 ADC","authors":"Sharvil Patil;Asha Ganesan;Hajime Shibata;Victor Kozlov;Gerry Taylor;Prawal Shrestha;Zhao Li;Zeynep Lulec;Konstantinos Vasilakopoulos;Raviteja Theertham;Donald Paterson;Qingnan Yu;Aseer Chowdhury","doi":"10.1109/JSSC.2024.3470516","DOIUrl":null,"url":null,"abstract":"This paper describes a continuous-time (CT) pipelined analog-to-digital converter (ADC) that represents a technology push along both—third-order distortion and noise—dimensions. Distortion is tackled using on-chip digital cancellation of static and timing digital-to-analog converter (DAC) mismatch errors. Low noise is achieved with design choices such as a resistive sub-DAC; a high-precision, on-chip, background-calibrated digital reconstruction filter (DRF); and a tunable LC lattice delay that allows a programmable sampling frequency. Implemented in a 16-nm FinFET process, the 6.4-GS/s prototype achieves an IM3 of −90 dBFS and a small-signal NSD of −164 dBFS/Hz over a 700-MHz bandwidth, while dissipating 703-mW power. Such performance makes it suitable for high-performance instrumentation and communications that demand robustness to large interferers while digitizing small signals.","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"59 12","pages":"4225-4236"},"PeriodicalIF":4.6000,"publicationDate":"2024-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A −90-dBFS-IM3, −164-dBFS/Hz-NSD, 700-MHz-Bandwidth Continuous-Time Pipelined ADC With Digital Cancellation of DAC Errors\",\"authors\":\"Sharvil Patil;Asha Ganesan;Hajime Shibata;Victor Kozlov;Gerry Taylor;Prawal Shrestha;Zhao Li;Zeynep Lulec;Konstantinos Vasilakopoulos;Raviteja Theertham;Donald Paterson;Qingnan Yu;Aseer Chowdhury\",\"doi\":\"10.1109/JSSC.2024.3470516\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a continuous-time (CT) pipelined analog-to-digital converter (ADC) that represents a technology push along both—third-order distortion and noise—dimensions. Distortion is tackled using on-chip digital cancellation of static and timing digital-to-analog converter (DAC) mismatch errors. Low noise is achieved with design choices such as a resistive sub-DAC; a high-precision, on-chip, background-calibrated digital reconstruction filter (DRF); and a tunable LC lattice delay that allows a programmable sampling frequency. Implemented in a 16-nm FinFET process, the 6.4-GS/s prototype achieves an IM3 of −90 dBFS and a small-signal NSD of −164 dBFS/Hz over a 700-MHz bandwidth, while dissipating 703-mW power. Such performance makes it suitable for high-performance instrumentation and communications that demand robustness to large interferers while digitizing small signals.\",\"PeriodicalId\":13129,\"journal\":{\"name\":\"IEEE Journal of Solid-state Circuits\",\"volume\":\"59 12\",\"pages\":\"4225-4236\"},\"PeriodicalIF\":4.6000,\"publicationDate\":\"2024-10-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Journal of Solid-state Circuits\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10715661/\",\"RegionNum\":1,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Journal of Solid-state Circuits","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10715661/","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
A −90-dBFS-IM3, −164-dBFS/Hz-NSD, 700-MHz-Bandwidth Continuous-Time Pipelined ADC With Digital Cancellation of DAC Errors
This paper describes a continuous-time (CT) pipelined analog-to-digital converter (ADC) that represents a technology push along both—third-order distortion and noise—dimensions. Distortion is tackled using on-chip digital cancellation of static and timing digital-to-analog converter (DAC) mismatch errors. Low noise is achieved with design choices such as a resistive sub-DAC; a high-precision, on-chip, background-calibrated digital reconstruction filter (DRF); and a tunable LC lattice delay that allows a programmable sampling frequency. Implemented in a 16-nm FinFET process, the 6.4-GS/s prototype achieves an IM3 of −90 dBFS and a small-signal NSD of −164 dBFS/Hz over a 700-MHz bandwidth, while dissipating 703-mW power. Such performance makes it suitable for high-performance instrumentation and communications that demand robustness to large interferers while digitizing small signals.
期刊介绍:
The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.