用实验室衍射仪测量 X 射线粉末衍射时试样位移的影响

IF 5.2 3区材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY

Journal of Applied Crystallography Pub Date : 2024-08-27 DOI:10.1107/S1600576724006460

M. Gateshki, Th. Dortmann, Th. Degen, M. Sadki, N. Norberg

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引用次数: 0

摘要

我们重新审视了实验室衍射仪在 X 射线粉末衍射实验中试样位移的影响，并针对几种常用的实验配置（包括布拉格-布伦塔诺准聚焦几何和平板透射几何）推导出了新的表达式。这项研究的结果允许对具有相对较大位移的样品数据进行分析。这为研究标准实验室衍射仪的样品处理能力难以适应的样品尺寸提供了可能。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

$Effect of specimen displacement in X-ray powder diffraction measurements with laboratory diffractometers$

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Effect of specimen displacement in X-ray powder diffraction measurements with laboratory diffractometers

The effect of specimen displacement in X-ray powder diffraction experiments with laboratory diffractometers has been revisited and new expressions have been derived for several commonly used experimental configurations, including Bragg–Brentano parafocusing geometry and flat-plate transmission geometry. The results presented in this work allow the analysis of data from samples with relatively large displacements. This may open the possibility to study samples with dimensions that are difficult to accommodate with the sample-handling capabilities of standard laboratory diffractometers.

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来源期刊

Journal of Applied Crystallography CHEMISTRY, MULTIDISCIPLINARYCRYSTALLOGRAPH-CRYSTALLOGRAPHY

CiteScore

7.80

自引率

3.30%

发文量

178

期刊介绍： Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.