掺杂钴的β-FeSi2 的结构和热电性能

IF 0.5 Q4 PHYSICS, CONDENSED MATTER

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2024-09-26 DOI:10.1134/S1027451024700496

F. Yu. Solomkin, N. V. Sharenkova, G. N. Isachenko, A. Yu. Samunin, A. A. Shabaldin, I. A. Kulik, N. A. Archarova, M. S. Lukasov

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引用次数: 0

摘要

研究了在二硅化铁中用钴替代铁的可能性。研究表明，在多种成分中，尝试用钴代替铁会形成钴硅化物。以成分 Fe0.98Co0.015Si2 为例，研究表明，在样品的定向结晶和随后的退火过程中，会形成规则的微观结构。沿样品结晶轴线和横跨结晶轴线可观察到热电性能的各向异性。在钴浓度较低的区域，过渡到纯β-FeSi2 时，热功率的符号和大小会发生急剧变化。

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Structure and Thermoelectric Properties of β-FeSi2 Doped with Cobalt

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Structure and Thermoelectric Properties of β-FeSi2 Doped with Cobalt

The possibility of replacing iron with cobalt in iron disilicide is studied. It has been shown that, in a wide range of compositions, an attempt to replace iron with cobalt leads to the formation of cobalt silicides. Using the composition Fe_0.98Co_0.015Si₂ as an example, it is shown that during the directional crystallization and subsequent annealing of samples, a regular microstructure is formed. Anisotropy of thermoelectric properties is observed along and across the crystallization axis of the sample. In the region of low cobalt concentrations, upon transition to pure β-FeSi₂, the sign and magnitude of thermopower change sharply.

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来源期刊

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques PHYSICS, CONDENSED MATTER-

CiteScore

0.90

自引率

25.00%

发文量

144

审稿时长

3-8 weeks

期刊介绍： Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.