中子反射仪数据显示的聚苯乙烯-富勒烯 С60/С70 纳米复合薄膜结构参数的温度依赖性

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
T. V. Tropin, M. V. Avdeev, V. L. Aksenov
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引用次数: 0

摘要

通过镜面中子反射仪研究了在 15-150°C 范围内聚合物基体玻璃化转变温度附近低纳米粒子含量的聚苯乙烯-富勒烯 C60/C70 纳米复合材料薄膜结构参数的温度依赖性。所得薄膜厚度的温度依赖性被用来估算薄膜复合材料的玻璃化转变温度。在含有 C60 富勒烯的薄膜中,该依赖关系具有标准形式。与纯聚合物的已知值相比,复合薄膜的玻璃化转变温度有所降低。在含有 C70 富勒烯的薄膜中,当过渡到高温时,观察到薄膜厚度的非单调依赖性,这阻碍了一般方法的应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Temperature Dependence of Structural Parameters of Thin Films of Polystyrene−Fullerene С60/С70 Nanocomposite According to Neutron Reflectometry Data

Temperature Dependence of Structural Parameters of Thin Films of Polystyrene−Fullerene С60/С70 Nanocomposite According to Neutron Reflectometry Data

The temperature dependences of the structural parameters of thin films of polystyrene–fullerene C60/C70 nanocomposites with a low content of nanoparticles in the vicinity of the glass transition temperature of the polymer matrix were studied by specular neutron reflectometry in the range of 15–150°C. The obtained temperature dependences of film thickness were used to estimate the glass transition temperature of film composites. In the case of films with C60 fullerene, the dependence had a standard form. The glass transition temperature of the composite film was found to decrease compared to the known value for the pure bulk polymer. In the case of films with C70 fullerene, upon transition to high temperatures, a nonmonotonic dependence of the film thickness was observed, which hindered application of the general approach.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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