含磷分散剂对石榴石结构闪烁陶瓷 (Gd,Y)3(Al,Ga)5O12:Ce 显微结构和光学特性的影响

IF 0.5 Q4 PHYSICS, CONDENSED MATTER

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2024-09-26 DOI:10.1134/S1027451024700733

P. V. Karpyuk, L. V. Ermakova, V. V. Dubov, D. E. Lelekova, R. R. Saifutyarov, P. A. Zhdanov, M. S. Malozovskaya, I. Yu. Komendo, P. S. Sokolov, A. G. Bondarau, M. V. Korzhik

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引用次数: 0

摘要

磷酸酯是商用分散剂的典型成分，会影响 Gd1.494Y1.494Ce0.012Al2Ga3O12 陶瓷的功能特性。在烧结陶瓷中，残余磷可高达引入量的 40-70%。颗粒表面掺入的磷在烧结过程中激活了晶粒的生长，并导致稀土磷酸盐次生相的形成。随着磷浓度的增加，陶瓷的密度和透光率都会降低。相对少量的磷可以改善陶瓷的发光特性，但大量的磷会增加磷光并降低闪烁光产率。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

Effect of Phosphorus-Containing Dispersant on the Microstructure and Optical Properties of Scintillation Ceramic (Gd,Y)3(Al,Ga)5O12:Ce with Garnet Structure

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Effect of Phosphorus-Containing Dispersant on the Microstructure and Optical Properties of Scintillation Ceramic (Gd,Y)3(Al,Ga)5O12:Ce with Garnet Structure

Phosphoric acid ester, a typical component of commercial dispersants, affects the functional properties of Gd_1.494Y_1.494Ce_0.012Al₂Ga₃O₁₂ ceramics. In sintered ceramics, the residual phosphorus can reach up to 40–70% of the introduced amount. The admixture of phosphorus located on the surfaces of the particles activates the grain growth during sintering and leads to the formation of secondary phases of rare-earth phosphates. With increasing phosphorus concentration, the density and optical transmittance of ceramics decrease. A relatively small amount of phosphorus can improve the luminescence properties of ceramics but large amounts can increase phosphorescence and reduce the scintillation light yield.

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来源期刊

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques PHYSICS, CONDENSED MATTER-

CiteScore

0.90

自引率

25.00%

发文量

144

审稿时长

3-8 weeks

期刊介绍： Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.