地震波电子显微镜

IF 1.5 4区 工程技术 Q3 MICROSCOPY
Shaoqing Chen, Mengyao Wang, Dong Sheng He
{"title":"地震波电子显微镜","authors":"Shaoqing Chen,&nbsp;Mengyao Wang,&nbsp;Dong Sheng He","doi":"10.1111/jmi.13364","DOIUrl":null,"url":null,"abstract":"<p>Changes in the surrounding environment, if transmitted to the electron microscope, are frequently perceived as noise that diminishes the quality of the images. However, in fact, ‘noises’ contain rich information about the environment. This work reports a very rare event where aberration-corrected HAADF-STEM images were acquired during the impact of seismic waves, resulted from a mild earthquake. By analysing these images, we found that the drift and vibration of the sample are detectable and quantifiable. Despite many potential challenges, this work demonstrates the utilisation of electron microscopes in detecting and monitoring seismic waves with high spatial resolution, which may lead to unique applications in the low-frequency regime.</p>","PeriodicalId":16484,"journal":{"name":"Journal of microscopy","volume":"297 1","pages":"3-12"},"PeriodicalIF":1.5000,"publicationDate":"2024-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Electron microscopy of seismic waves\",\"authors\":\"Shaoqing Chen,&nbsp;Mengyao Wang,&nbsp;Dong Sheng He\",\"doi\":\"10.1111/jmi.13364\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>Changes in the surrounding environment, if transmitted to the electron microscope, are frequently perceived as noise that diminishes the quality of the images. However, in fact, ‘noises’ contain rich information about the environment. This work reports a very rare event where aberration-corrected HAADF-STEM images were acquired during the impact of seismic waves, resulted from a mild earthquake. By analysing these images, we found that the drift and vibration of the sample are detectable and quantifiable. Despite many potential challenges, this work demonstrates the utilisation of electron microscopes in detecting and monitoring seismic waves with high spatial resolution, which may lead to unique applications in the low-frequency regime.</p>\",\"PeriodicalId\":16484,\"journal\":{\"name\":\"Journal of microscopy\",\"volume\":\"297 1\",\"pages\":\"3-12\"},\"PeriodicalIF\":1.5000,\"publicationDate\":\"2024-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of microscopy\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1111/jmi.13364\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"MICROSCOPY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of microscopy","FirstCategoryId":"5","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1111/jmi.13364","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MICROSCOPY","Score":null,"Total":0}
引用次数: 0

摘要

周围环境的变化如果传递到电子显微镜上,通常会被认为是降低图像质量的噪音。但事实上,"噪音 "包含了丰富的环境信息。这项工作报告了一个非常罕见的事件:在一次轻微地震中,我们在地震波的冲击下获取了经过像差校正的 HAADF-STEM 图像。通过分析这些图像,我们发现样品的漂移和振动是可以检测和量化的。尽管存在许多潜在的挑战,但这项工作证明了电子显微镜在探测和监测地震波时具有很高的空间分辨率,可能会在低频领域产生独特的应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Electron microscopy of seismic waves

Changes in the surrounding environment, if transmitted to the electron microscope, are frequently perceived as noise that diminishes the quality of the images. However, in fact, ‘noises’ contain rich information about the environment. This work reports a very rare event where aberration-corrected HAADF-STEM images were acquired during the impact of seismic waves, resulted from a mild earthquake. By analysing these images, we found that the drift and vibration of the sample are detectable and quantifiable. Despite many potential challenges, this work demonstrates the utilisation of electron microscopes in detecting and monitoring seismic waves with high spatial resolution, which may lead to unique applications in the low-frequency regime.

求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Journal of microscopy
Journal of microscopy 工程技术-显微镜技术
CiteScore
4.30
自引率
5.00%
发文量
83
审稿时长
1 months
期刊介绍: The Journal of Microscopy is the oldest journal dedicated to the science of microscopy and the only peer-reviewed publication of the Royal Microscopical Society. It publishes papers that report on the very latest developments in microscopy such as advances in microscopy techniques or novel areas of application. The Journal does not seek to publish routine applications of microscopy or specimen preparation even though the submission may otherwise have a high scientific merit. The scope covers research in the physical and biological sciences and covers imaging methods using light, electrons, X-rays and other radiations as well as atomic force and near field techniques. Interdisciplinary research is welcome. Papers pertaining to microscopy are also welcomed on optical theory, spectroscopy, novel specimen preparation and manipulation methods and image recording, processing and analysis including dynamic analysis of living specimens. Publication types include full papers, hot topic fast tracked communications and review articles. Authors considering submitting a review article should contact the editorial office first.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信