{"title":"地震波电子显微镜","authors":"Shaoqing Chen, Mengyao Wang, Dong Sheng He","doi":"10.1111/jmi.13364","DOIUrl":null,"url":null,"abstract":"<p>Changes in the surrounding environment, if transmitted to the electron microscope, are frequently perceived as noise that diminishes the quality of the images. However, in fact, ‘noises’ contain rich information about the environment. This work reports a very rare event where aberration-corrected HAADF-STEM images were acquired during the impact of seismic waves, resulted from a mild earthquake. By analysing these images, we found that the drift and vibration of the sample are detectable and quantifiable. Despite many potential challenges, this work demonstrates the utilisation of electron microscopes in detecting and monitoring seismic waves with high spatial resolution, which may lead to unique applications in the low-frequency regime.</p>","PeriodicalId":16484,"journal":{"name":"Journal of microscopy","volume":"297 1","pages":"3-12"},"PeriodicalIF":1.5000,"publicationDate":"2024-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Electron microscopy of seismic waves\",\"authors\":\"Shaoqing Chen, Mengyao Wang, Dong Sheng He\",\"doi\":\"10.1111/jmi.13364\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>Changes in the surrounding environment, if transmitted to the electron microscope, are frequently perceived as noise that diminishes the quality of the images. However, in fact, ‘noises’ contain rich information about the environment. This work reports a very rare event where aberration-corrected HAADF-STEM images were acquired during the impact of seismic waves, resulted from a mild earthquake. By analysing these images, we found that the drift and vibration of the sample are detectable and quantifiable. Despite many potential challenges, this work demonstrates the utilisation of electron microscopes in detecting and monitoring seismic waves with high spatial resolution, which may lead to unique applications in the low-frequency regime.</p>\",\"PeriodicalId\":16484,\"journal\":{\"name\":\"Journal of microscopy\",\"volume\":\"297 1\",\"pages\":\"3-12\"},\"PeriodicalIF\":1.5000,\"publicationDate\":\"2024-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of microscopy\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1111/jmi.13364\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"MICROSCOPY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of microscopy","FirstCategoryId":"5","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1111/jmi.13364","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MICROSCOPY","Score":null,"Total":0}
Changes in the surrounding environment, if transmitted to the electron microscope, are frequently perceived as noise that diminishes the quality of the images. However, in fact, ‘noises’ contain rich information about the environment. This work reports a very rare event where aberration-corrected HAADF-STEM images were acquired during the impact of seismic waves, resulted from a mild earthquake. By analysing these images, we found that the drift and vibration of the sample are detectable and quantifiable. Despite many potential challenges, this work demonstrates the utilisation of electron microscopes in detecting and monitoring seismic waves with high spatial resolution, which may lead to unique applications in the low-frequency regime.
期刊介绍:
The Journal of Microscopy is the oldest journal dedicated to the science of microscopy and the only peer-reviewed publication of the Royal Microscopical Society. It publishes papers that report on the very latest developments in microscopy such as advances in microscopy techniques or novel areas of application. The Journal does not seek to publish routine applications of microscopy or specimen preparation even though the submission may otherwise have a high scientific merit.
The scope covers research in the physical and biological sciences and covers imaging methods using light, electrons, X-rays and other radiations as well as atomic force and near field techniques. Interdisciplinary research is welcome. Papers pertaining to microscopy are also welcomed on optical theory, spectroscopy, novel specimen preparation and manipulation methods and image recording, processing and analysis including dynamic analysis of living specimens.
Publication types include full papers, hot topic fast tracked communications and review articles. Authors considering submitting a review article should contact the editorial office first.