对未固定的植物样本进行真空中微 PIXE 和空气中微 PIXE 的比较

IF 1.4 3区物理与天体物理 Q3 INSTRUMENTS & INSTRUMENTATION

Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms Pub Date : 2024-09-28 DOI:10.1016/j.nimb.2024.165536

Misako Miwa , Ayumi Nakatsuma , Shigeo Matsuyama , Sho Toyama , Takeshi Uchiyama , Yasuhiro Ishimaru , Nobuyuki Uozumi

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引用次数: 0

摘要

PIXE 分析对于同时测定各种元素非常有用。通常情况下，在真空中对含水量较高的生物样本进行显微 PIXE 分析时，会使用冷冻干燥法来固定结构，并以受控方式去除存在的冰晶，以防止样本中的元素含量发生变化或重新分布。这种方法对于细胞大小分析至关重要。不过，我们认为植物组织大小的宏观分析并不总是需要固定。因此，我们根据拟南芥叶片在空气中和真空中进行微量-PIXE 分析所获得的元素密度比，研究了元素密度随真空萃取发生变化的程度。我们还通过拟南芥花瓣的 STIM 和 RBS 分析评估了光束照射引起的变形以及样品中 C、O 和 H 的定量变化。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Comparison of in-vacuum micro-PIXE and in-air micro-PIXE for unfixed plant sample

PIXE analysis is very useful for the simultaneous determination of various elements. Typically, when micro-PIXE analysis of biological samples with high water content is performed in a vacuum, freeze-drying methods are used to fix the structure and remove any ice crystals present in a controlled manner to prevent changes or redistribution of elemental content in the sample. This method is essential for cell size analysis. However, we considered that fixation is not always necessary for macroscopic analysis of plant tissue size. Therefore, we investigated the extent to which elemental density changes with vacuum extraction from elemental density ratios obtained from micro-PIXE analysis of Arabidopsis thaliana leaves in-air and in-vacuum. The deformation caused by beam irradiation and the quantitative changes of C, O, and H in the samples were also evaluated by STIM and RBS analyses of Arabidopsis thaliana petal.

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来源期刊

Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms 物理-核科学技术

CiteScore

2.80

自引率

7.70%

发文量

231

审稿时长

1.9 months

期刊介绍： Section B of Nuclear Instruments and Methods in Physics Research covers all aspects of the interaction of energetic beams with atoms, molecules and aggregate forms of matter. This includes ion beam analysis and ion beam modification of materials as well as basic data of importance for these studies. Topics of general interest include: atomic collisions in solids, particle channelling, all aspects of collision cascades, the modification of materials by energetic beams, ion implantation, irradiation - induced changes in materials, the physics and chemistry of beam interactions and the analysis of materials by all forms of energetic radiation. Modification by ion, laser and electron beams for the study of electronic materials, metals, ceramics, insulators, polymers and other important and new materials systems are included. Related studies, such as the application of ion beam analysis to biological, archaeological and geological samples as well as applications to solve problems in planetary science are also welcome. Energetic beams of interest include atomic and molecular ions, neutrons, positrons and muons, plasmas directed at surfaces, electron and photon beams, including laser treated surfaces and studies of solids by photon radiation from rotating anodes, synchrotrons, etc. In addition, the interaction between various forms of radiation and radiation-induced deposition processes are relevant.