{"title":"基于 SVD 定义特征模式的无相近场扫描源建模优化","authors":"Min-Hsu Tsai;Hong-Wen Qian;Wei-Kai Chen;Ming-Chung Huang;Jen-Chieh Liu;Ruey-Beei Wu","doi":"10.1109/TEMC.2024.3449375","DOIUrl":null,"url":null,"abstract":"This article proposes a procedure for reconstructing dipole moment models from magnitude-only near-field scanned magnetic fields. Preprocessing uses a finite-impulse response filter to deblur the 2-D divergence of the magnetic fields to locate the dipoles. The procedure defines the modes of the dipole distribution using singular value decomposition. Based on mode decomposition, the modal coefficients are optimized through a pattern search algorithm to obtain the dipole moments. Compared with existing methods, this method reconstructs better phase information in high-noise situations. Using mode decomposition circumvents the problem of a limited number of dipoles that can be solved by existing optimization methods. Real experiments using high-resolution near-field scanned data show that the main emission sources of individual traces inside an integrated circuit (IC) chip can be distinguished through the proposed procedure.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"66 6","pages":"1876-1887"},"PeriodicalIF":2.0000,"publicationDate":"2024-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Optimization of Source Modeling From Phaseless Near-Field Scanning Based on SVD-Defined Eigenmodes\",\"authors\":\"Min-Hsu Tsai;Hong-Wen Qian;Wei-Kai Chen;Ming-Chung Huang;Jen-Chieh Liu;Ruey-Beei Wu\",\"doi\":\"10.1109/TEMC.2024.3449375\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article proposes a procedure for reconstructing dipole moment models from magnitude-only near-field scanned magnetic fields. Preprocessing uses a finite-impulse response filter to deblur the 2-D divergence of the magnetic fields to locate the dipoles. The procedure defines the modes of the dipole distribution using singular value decomposition. Based on mode decomposition, the modal coefficients are optimized through a pattern search algorithm to obtain the dipole moments. Compared with existing methods, this method reconstructs better phase information in high-noise situations. Using mode decomposition circumvents the problem of a limited number of dipoles that can be solved by existing optimization methods. Real experiments using high-resolution near-field scanned data show that the main emission sources of individual traces inside an integrated circuit (IC) chip can be distinguished through the proposed procedure.\",\"PeriodicalId\":55012,\"journal\":{\"name\":\"IEEE Transactions on Electromagnetic Compatibility\",\"volume\":\"66 6\",\"pages\":\"1876-1887\"},\"PeriodicalIF\":2.0000,\"publicationDate\":\"2024-09-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Electromagnetic Compatibility\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10693322/\",\"RegionNum\":3,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electromagnetic Compatibility","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10693322/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Optimization of Source Modeling From Phaseless Near-Field Scanning Based on SVD-Defined Eigenmodes
This article proposes a procedure for reconstructing dipole moment models from magnitude-only near-field scanned magnetic fields. Preprocessing uses a finite-impulse response filter to deblur the 2-D divergence of the magnetic fields to locate the dipoles. The procedure defines the modes of the dipole distribution using singular value decomposition. Based on mode decomposition, the modal coefficients are optimized through a pattern search algorithm to obtain the dipole moments. Compared with existing methods, this method reconstructs better phase information in high-noise situations. Using mode decomposition circumvents the problem of a limited number of dipoles that can be solved by existing optimization methods. Real experiments using high-resolution near-field scanned data show that the main emission sources of individual traces inside an integrated circuit (IC) chip can be distinguished through the proposed procedure.
期刊介绍:
IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.