利用先进的调频静电力显微镜对 PANI/PSS 薄膜中的电荷/掺杂剂分布进行直接成像

IF 3.7 2区化学 Q2 CHEMISTRY, MULTIDISCIPLINARY

Langmuir Pub Date : 2024-09-24 DOI:10.1021/acs.langmuir.4c02012

Priyanka Ranka, Virendra Sethi, Aliasgar Q. Contractor

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引用次数: 0

摘要

本文详细研究了聚苯胺-聚（苯乙烯磺酸）（PANI/PSS）电聚合薄膜的表面电荷和掺杂剂分布。研究重点是 PANI/PSS 的两种不同状态：完全掺杂的祖母绿盐 (ES/PSS) 和掺杂的祖母绿碱 (EB/PSS)。这项研究采用了先进的频率调制静电力显微镜（FM-EFM）和原子力显微镜（AFM）。聚合物薄膜由聚合物晶粒组成，FM-EFM 数据表明，掺杂剂在晶粒表面的分布不均匀，外围的掺杂程度高于核心。对 ES/PSS 和 EB/PSS 晶粒外围和核心的电荷进行量化，可以让我们深入了解聚合物薄膜内的电荷分布。据估计，外围区域的电荷密度（∼120 μC/cm2）是核心区域（∼11 μC/cm2）的 10 倍，是 EB/PSS 的 100 倍（∼0.8 μC/cm2）。我们利用原子力显微镜（AFM）形貌剖面直接观察了 PANI/PSS 从 ES/PSS 状态到 EB/PSS 状态的形貌变化。这些发现使我们对聚合物薄膜表面的电荷/掺杂剂分布行为有了更好的理解，为进一步研究和开发基于 PANI/PSS 的电子器件铺平了道路。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

Direct Imaging of Charge/Dopant Distribution in PANI/PSS Thin Films Using Advanced Frequency Modulation Electrostatic Force Microscopy

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Direct Imaging of Charge/Dopant Distribution in PANI/PSS Thin Films Using Advanced Frequency Modulation Electrostatic Force Microscopy

This paper presents a detailed study that maps the surface charges and dopant distribution on the electropolymerized thin film of polyaniline–poly(styrenesulfonate) (PANI/PSS). The focus is on two distinct states of PANI/PSS: the fully doped emeraldine salt (ES/PSS) and the dedoped emeraldine base (EB/PSS). This investigation utilizes advanced frequency modulation electrostatic force microscopy (FM-EFM) and atomic force microscopy (AFM). The polymer film comprises polymer grains, and FM-EFM data suggest a non-uniform distribution of dopants on the grain surface, with a higher doped periphery than the core. Quantifying the charge at the periphery and core of ES/PSS and EB/PSS grains provides unique insight into the charge distribution within the polymer film. The charge density is estimated to be 10 times higher in the periphery region (∼120 μC/cm²) than in the core region (∼11 μC/cm²) and 100 times higher than EB/PSS (∼0.8 μC/cm²). We have directly observed the morphological changes of PANI/PSS from the ES/PSS state to the EB/PSS state using the AFM topographic profile. These findings provide a better understanding of the behavior of the charge/dopant distribution on the surface of the polymer films and pave the way for further research and development of PANI/PSS-based electronic devices.

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来源期刊

Langmuir 化学-材料科学：综合

CiteScore

6.50

自引率

10.30%

发文量

1464

审稿时长

2.1 months

期刊介绍： Langmuir is an interdisciplinary journal publishing articles in the following subject categories: Colloids: surfactants and self-assembly, dispersions, emulsions, foams Interfaces: adsorption, reactions, films, forces Biological Interfaces: biocolloids, biomolecular and biomimetic materials Materials: nano- and mesostructured materials, polymers, gels, liquid crystals Electrochemistry: interfacial charge transfer, charge transport, electrocatalysis, electrokinetic phenomena, bioelectrochemistry Devices and Applications: sensors, fluidics, patterning, catalysis, photonic crystals However, when high-impact, original work is submitted that does not fit within the above categories, decisions to accept or decline such papers will be based on one criteria: What Would Irving Do? Langmuir ranks #2 in citations out of 136 journals in the category of Physical Chemistry with 113,157 total citations. The journal received an Impact Factor of 4.384*. This journal is also indexed in the categories of Materials Science (ranked #1) and Multidisciplinary Chemistry (ranked #5).