{"title":"通过同步辐射 X 射线衍射拓扑观察 BaTiO3 中的铁电畴","authors":"Kenji Ohwada and Akihiko Machida","doi":"10.35848/1347-4065/ad6e93","DOIUrl":null,"url":null,"abstract":"X-ray diffraction topography was used to observe two distinct ferroelectric domains in BaTiO3. The use of highly-parallel X-rays and a high-resolution detector with approximately 200 nm resolution enabled us to successfully characterize two distinct domains, each with sizes of the order of 10 μm. Along with the local rocking curve of the bulk crystal, we generated width maps corresponding to crystal properties including defects and, strain. This information is beneficial for understanding domain behavior, and the measurement system can be expected to become a powerful tool for in situ measurements of processes requiring domain control.","PeriodicalId":14741,"journal":{"name":"Japanese Journal of Applied Physics","volume":"56 1","pages":""},"PeriodicalIF":1.5000,"publicationDate":"2024-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Observation of ferroelectric domains in BaTiO3 by synchrotron radiation X-ray diffraction topography\",\"authors\":\"Kenji Ohwada and Akihiko Machida\",\"doi\":\"10.35848/1347-4065/ad6e93\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"X-ray diffraction topography was used to observe two distinct ferroelectric domains in BaTiO3. The use of highly-parallel X-rays and a high-resolution detector with approximately 200 nm resolution enabled us to successfully characterize two distinct domains, each with sizes of the order of 10 μm. Along with the local rocking curve of the bulk crystal, we generated width maps corresponding to crystal properties including defects and, strain. This information is beneficial for understanding domain behavior, and the measurement system can be expected to become a powerful tool for in situ measurements of processes requiring domain control.\",\"PeriodicalId\":14741,\"journal\":{\"name\":\"Japanese Journal of Applied Physics\",\"volume\":\"56 1\",\"pages\":\"\"},\"PeriodicalIF\":1.5000,\"publicationDate\":\"2024-09-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Japanese Journal of Applied Physics\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://doi.org/10.35848/1347-4065/ad6e93\",\"RegionNum\":4,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"PHYSICS, APPLIED\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Japanese Journal of Applied Physics","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.35848/1347-4065/ad6e93","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}
引用次数: 0
摘要
我们利用 X 射线衍射拓扑图观察了 BaTiO3 中两个不同的铁电畴。利用高度平行的 X 射线和分辨率约为 200 nm 的高分辨率探测器,我们成功地确定了两个不同畴的特征,每个畴的大小约为 10 μm。我们生成了与晶体属性(包括缺陷和应变)相对应的宽度图,以及块状晶体的局部摇摆曲线。这些信息有助于了解畴的行为,该测量系统有望成为现场测量需要畴控制的过程的有力工具。
Observation of ferroelectric domains in BaTiO3 by synchrotron radiation X-ray diffraction topography
X-ray diffraction topography was used to observe two distinct ferroelectric domains in BaTiO3. The use of highly-parallel X-rays and a high-resolution detector with approximately 200 nm resolution enabled us to successfully characterize two distinct domains, each with sizes of the order of 10 μm. Along with the local rocking curve of the bulk crystal, we generated width maps corresponding to crystal properties including defects and, strain. This information is beneficial for understanding domain behavior, and the measurement system can be expected to become a powerful tool for in situ measurements of processes requiring domain control.
期刊介绍:
The Japanese Journal of Applied Physics (JJAP) is an international journal for the advancement and dissemination of knowledge in all fields of applied physics. JJAP is a sister journal of the Applied Physics Express (APEX) and is published by IOP Publishing Ltd on behalf of the Japan Society of Applied Physics (JSAP).
JJAP publishes articles that significantly contribute to the advancements in the applications of physical principles as well as in the understanding of physics in view of particular applications in mind. Subjects covered by JJAP include the following fields:
• Semiconductors, dielectrics, and organic materials
• Photonics, quantum electronics, optics, and spectroscopy
• Spintronics, superconductivity, and strongly correlated materials
• Device physics including quantum information processing
• Physics-based circuits and systems
• Nanoscale science and technology
• Crystal growth, surfaces, interfaces, thin films, and bulk materials
• Plasmas, applied atomic and molecular physics, and applied nuclear physics
• Device processing, fabrication and measurement technologies, and instrumentation
• Cross-disciplinary areas such as bioelectronics/photonics, biosensing, environmental/energy technologies, and MEMS