Til Hillebrecht;Morten Schierholz;Youcef Hassab;Johannes Alfert;Christian Schuster
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引用次数: 0
摘要
在本文中,使用基于高速互连的印刷电路板(PCB)的非常大的数据集进行了物理启发和数据驱动的分析。三个不同的子集定义了大约15000个PCB材料和几何变化。据作者所知,该数据集是有史以来为信号完整性(SI)目的生成和应用的最大数据集。该数据集是使用精确的基于物理的(PB)建模生成的,最高可达$60 \,\ mathm {G}\ mathm {Hz}$,并提供SI/ pi数据库下载。前两个子集由单端和差分通孔阵列组成,多达116个端口,任意位置用于信号、电源和接地通孔。第三个子集表示两个通过阵列之间的差分传输线上的链路。执行数据和机器学习(ML)分析,显示PCB参数与PCI Gen 6时钟频率之间的依赖关系。大而现实的定义设计空间反映了SI设计问题的高复杂性和维度,并允许基于ml的多用途分析。
Generation and Application of a Very Large Dataset for Signal Integrity Via Array and Link Analysis
In this article, a physics inspired and data-driven analysis is performed using a very large dataset of printed circuit board (PCB) based high-speed interconnects. Three different subsets are defined having approximately 15000 PCB material and geometry variations. To the authors' knowledge, this dataset is the largest ever generated and applied dataset for signal integrity (SI) purposes. The dataset is generated using accurate physics based (PB) modeling up to
$60 \,\mathrm{G}\mathrm{Hz}$
and provided for download in the SI/PI-Database. The first two subsets consist of a single-ended and a differential via array with up to 116 ports with arbitrary positions for signal, power, and ground vias. The third subset represents a link over differential transmission lines between two via arrays. A data and machine learning (ML) analysis is performed showing the dependencies between the PCB parameters and clock frequency of PCI Gen 6. The large and realistic defined design spaces reflect the high complexity and dimensionality of the SI design problems and allow multipurpose ML-based analysis.
期刊介绍:
IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.