通过计算幽灵成像提高透射电子显微镜的分辨率

IF 8.1 1区物理与天体物理 Q1 PHYSICS, MULTIDISCIPLINARY

Physical review letters Pub Date : 2024-09-18 DOI:10.1103/physrevlett.133.123801

P. Rosi, L. Viani, E. Rotunno, S. Frabboni, A. H. Tavabi, R. E. Dunin-Borkowski, A. Roncaglia, V. Grillo

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引用次数: 0

摘要

通过数值模拟，我们展示了在透射电子显微镜中计算鬼影成像的创新应用，以获取具有克服相干像差限制的分辨率的图像。这种方法需要通过一系列结构化照明来测量单像素探测器上的强度。如果探针与样品相似，且图案均匀地覆盖感兴趣的区域，则可提高该技术的成功率。以一个简单的 8 个电极装置为例，证明在实际实验条件下，可以将分辨率提高两倍，超过像差极限。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

Increasing the Resolution of Transmission Electron Microscopy by Computational Ghost Imaging

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Increasing the Resolution of Transmission Electron Microscopy by Computational Ghost Imaging

By means of numerical simulations, we demonstrate the innovative use of computational ghost imaging in transmission electron microscopy to retrieve images with a resolution that overcomes the limitations imposed by coherent aberrations. The method requires measuring the intensity on a single pixel detector with a series of structured illuminations. The success of the technique is improved if the probes are made to resemble the sample and the patterns cover the area of interest evenly. By using a simple 8 electrode device as a specific example, a twofold increase in resolution beyond the aberration limit is demonstrated to be possible under realistic experimental conditions.

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来源期刊

Physical review letters 物理-物理：综合

CiteScore

16.50

自引率

7.00%

发文量

2673

审稿时长

2.2 months

期刊介绍： Physical review letters(PRL)covers the full range of applied, fundamental, and interdisciplinary physics research topics: General physics, including statistical and quantum mechanics and quantum information Gravitation, astrophysics, and cosmology Elementary particles and fields Nuclear physics Atomic, molecular, and optical physics Nonlinear dynamics, fluid dynamics, and classical optics Plasma and beam physics Condensed matter and materials physics Polymers, soft matter, biological, climate and interdisciplinary physics, including networks