{"title":"具有石墨烯沟道的 Z 型栅隧道场效应晶体管:对其模拟和线性性能的广泛研究","authors":"Gunti Sneha , Sidhartha Dash , Guru Prasad Mishra","doi":"10.1016/j.mejo.2024.106412","DOIUrl":null,"url":null,"abstract":"<div><p>This work analyzes a graphene channel Z-shaped gate tunnel FET's (ZTFET) analog, and linearity performance. This research aims to introduce graphene with a two-dimensional honeycomb structure that is anticipated to be a strong challenger for the upcoming generation of semiconductor devices. The ZTFET with graphene channel provides a 3-decade increase in ON current, indicating a notable improvement in gate capacitance and transconductance compared to the conventional silicon channel. This improvement further leads to better linearity and analog/RF performance. We delved into various linearity and Radio Frequency (RF) figure-of-merits, including g<sub>mn</sub>, VIP<sub>2</sub>, VIP<sub>3</sub>, IIP<sub>3</sub>, 1‐dB compression point, GBWP, TFP, unity gain cut‐off frequency, and maximum oscillation frequency. The results of the new GC-ZTFET are compared with those of the traditional ZTFET to establish its superiority. The GC-ZTFET outshines other device structures when speaking of linearity, RF performance, and current-carrying capability.</p></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":null,"pages":null},"PeriodicalIF":1.9000,"publicationDate":"2024-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Z-shaped gate tunnel FET with graphene channel: An extensive investigation of its analog and linearity performance\",\"authors\":\"Gunti Sneha , Sidhartha Dash , Guru Prasad Mishra\",\"doi\":\"10.1016/j.mejo.2024.106412\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>This work analyzes a graphene channel Z-shaped gate tunnel FET's (ZTFET) analog, and linearity performance. This research aims to introduce graphene with a two-dimensional honeycomb structure that is anticipated to be a strong challenger for the upcoming generation of semiconductor devices. The ZTFET with graphene channel provides a 3-decade increase in ON current, indicating a notable improvement in gate capacitance and transconductance compared to the conventional silicon channel. This improvement further leads to better linearity and analog/RF performance. We delved into various linearity and Radio Frequency (RF) figure-of-merits, including g<sub>mn</sub>, VIP<sub>2</sub>, VIP<sub>3</sub>, IIP<sub>3</sub>, 1‐dB compression point, GBWP, TFP, unity gain cut‐off frequency, and maximum oscillation frequency. The results of the new GC-ZTFET are compared with those of the traditional ZTFET to establish its superiority. The GC-ZTFET outshines other device structures when speaking of linearity, RF performance, and current-carrying capability.</p></div>\",\"PeriodicalId\":49818,\"journal\":{\"name\":\"Microelectronics Journal\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2024-09-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectronics Journal\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S1879239124001164\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1879239124001164","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Z-shaped gate tunnel FET with graphene channel: An extensive investigation of its analog and linearity performance
This work analyzes a graphene channel Z-shaped gate tunnel FET's (ZTFET) analog, and linearity performance. This research aims to introduce graphene with a two-dimensional honeycomb structure that is anticipated to be a strong challenger for the upcoming generation of semiconductor devices. The ZTFET with graphene channel provides a 3-decade increase in ON current, indicating a notable improvement in gate capacitance and transconductance compared to the conventional silicon channel. This improvement further leads to better linearity and analog/RF performance. We delved into various linearity and Radio Frequency (RF) figure-of-merits, including gmn, VIP2, VIP3, IIP3, 1‐dB compression point, GBWP, TFP, unity gain cut‐off frequency, and maximum oscillation frequency. The results of the new GC-ZTFET are compared with those of the traditional ZTFET to establish its superiority. The GC-ZTFET outshines other device structures when speaking of linearity, RF performance, and current-carrying capability.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.
Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.