A. Neffah, H. Tabet-Derraz, M. A. Benali, K. M. E. Boureguig, M. Z. Belmehdi, H. Saci
{"title":"薄膜的结构、形态、光学和电学特性研究:有效介质理论在氧化镉/氧化钴复合材料中的应用","authors":"A. Neffah, H. Tabet-Derraz, M. A. Benali, K. M. E. Boureguig, M. Z. Belmehdi, H. Saci","doi":"10.1007/s10854-024-13392-9","DOIUrl":null,"url":null,"abstract":"<div><p>Thin films of cadmium oxide (CdO), cobalt oxide (Co<sub>3</sub>O<sub>4</sub>), and their composites were deposited on glass substrates at 360 ℃ using the spray pyrolysis method. The films underwent characterization through various techniques, including energy-dispersive X-ray spectroscopy (EDX), scanning electron microscope (SEM), X-ray diffraction (XRD), and ultraviolet–visible spectroscopy (UV–Vis). Hall Effect measurements were also conducted to assess the structural, optical, and electrical properties. The XRD analysis revealed crystalline structures with cubic symmetry for both CdO and Co<sub>3</sub>O<sub>4</sub>, and the Scherrer equation confirmed their nanomaterial nature. EDX results identified the distinct proportions of oxygen, cadmium, and cobalt in the films. On the other hand, the optical band gaps determined via Tauc plots indicated values of Eg1 = 1.54 eV and Eg2 = 2.01 eV for Co<sub>3</sub>O<sub>4</sub>, and Eg3 = 2.4 eV for CdO. As for the Hall Effect measurements, they were performed to determine a number of electrical parameters. The results showed that the addition of Co<sub>3</sub>O<sub>4</sub> into CdO increased the sheet resistance of the composite. This research has potential applications in various areas, including the design of solar cells (photovoltaic devices) and the creation of new light-based devices (optoelectronic devices). Additionally, the dielectric functions of composites (CdO)<sub>x</sub> (Co<sub>3</sub>O<sub>4</sub>)<sub>1-x</sub> with varying compositions (<i>x</i> = 0.7, 0.5, and 0.3) were evaluated. The dielectric properties were experimentally measured from 350 to 2500 nm, and theoretical calculations were performed using mixing equations like Looyenga, Kim, and Bruggman, with the Looyenga model accurately depicting the dielectric properties of the materials studied.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":null,"pages":null},"PeriodicalIF":2.8000,"publicationDate":"2024-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Investigation of the structural, morphological, optical, and electrical properties of thin films: application of effective medium theories to CdO/Co3O4 composites\",\"authors\":\"A. Neffah, H. Tabet-Derraz, M. A. Benali, K. M. E. Boureguig, M. Z. Belmehdi, H. Saci\",\"doi\":\"10.1007/s10854-024-13392-9\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Thin films of cadmium oxide (CdO), cobalt oxide (Co<sub>3</sub>O<sub>4</sub>), and their composites were deposited on glass substrates at 360 ℃ using the spray pyrolysis method. The films underwent characterization through various techniques, including energy-dispersive X-ray spectroscopy (EDX), scanning electron microscope (SEM), X-ray diffraction (XRD), and ultraviolet–visible spectroscopy (UV–Vis). Hall Effect measurements were also conducted to assess the structural, optical, and electrical properties. The XRD analysis revealed crystalline structures with cubic symmetry for both CdO and Co<sub>3</sub>O<sub>4</sub>, and the Scherrer equation confirmed their nanomaterial nature. EDX results identified the distinct proportions of oxygen, cadmium, and cobalt in the films. On the other hand, the optical band gaps determined via Tauc plots indicated values of Eg1 = 1.54 eV and Eg2 = 2.01 eV for Co<sub>3</sub>O<sub>4</sub>, and Eg3 = 2.4 eV for CdO. As for the Hall Effect measurements, they were performed to determine a number of electrical parameters. The results showed that the addition of Co<sub>3</sub>O<sub>4</sub> into CdO increased the sheet resistance of the composite. This research has potential applications in various areas, including the design of solar cells (photovoltaic devices) and the creation of new light-based devices (optoelectronic devices). Additionally, the dielectric functions of composites (CdO)<sub>x</sub> (Co<sub>3</sub>O<sub>4</sub>)<sub>1-x</sub> with varying compositions (<i>x</i> = 0.7, 0.5, and 0.3) were evaluated. The dielectric properties were experimentally measured from 350 to 2500 nm, and theoretical calculations were performed using mixing equations like Looyenga, Kim, and Bruggman, with the Looyenga model accurately depicting the dielectric properties of the materials studied.</p></div>\",\"PeriodicalId\":646,\"journal\":{\"name\":\"Journal of Materials Science: Materials in Electronics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2024-08-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Materials Science: Materials in Electronics\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s10854-024-13392-9\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-024-13392-9","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Investigation of the structural, morphological, optical, and electrical properties of thin films: application of effective medium theories to CdO/Co3O4 composites
Thin films of cadmium oxide (CdO), cobalt oxide (Co3O4), and their composites were deposited on glass substrates at 360 ℃ using the spray pyrolysis method. The films underwent characterization through various techniques, including energy-dispersive X-ray spectroscopy (EDX), scanning electron microscope (SEM), X-ray diffraction (XRD), and ultraviolet–visible spectroscopy (UV–Vis). Hall Effect measurements were also conducted to assess the structural, optical, and electrical properties. The XRD analysis revealed crystalline structures with cubic symmetry for both CdO and Co3O4, and the Scherrer equation confirmed their nanomaterial nature. EDX results identified the distinct proportions of oxygen, cadmium, and cobalt in the films. On the other hand, the optical band gaps determined via Tauc plots indicated values of Eg1 = 1.54 eV and Eg2 = 2.01 eV for Co3O4, and Eg3 = 2.4 eV for CdO. As for the Hall Effect measurements, they were performed to determine a number of electrical parameters. The results showed that the addition of Co3O4 into CdO increased the sheet resistance of the composite. This research has potential applications in various areas, including the design of solar cells (photovoltaic devices) and the creation of new light-based devices (optoelectronic devices). Additionally, the dielectric functions of composites (CdO)x (Co3O4)1-x with varying compositions (x = 0.7, 0.5, and 0.3) were evaluated. The dielectric properties were experimentally measured from 350 to 2500 nm, and theoretical calculations were performed using mixing equations like Looyenga, Kim, and Bruggman, with the Looyenga model accurately depicting the dielectric properties of the materials studied.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.