{"title":"兆电子伏能量碳离子产生的次级电子诱发的液态水辐射分解","authors":"Hidetsugu Tsuchida, Tomoya Tezuka, Takeshi Kai, Yusuke Matsuya, Takuya Majima, Manabu Saito","doi":"10.1063/5.0227465","DOIUrl":null,"url":null,"abstract":"Fast ion beams induce damage to deoxyribonucleic acid (DNA) by chemical products, including secondary electrons, produced from interaction with liquid water in living cells. However, the production process of these chemical products in the Bragg peak region used in particle therapy is not fully understood. To investigate this process, we conducted experiments to evaluate the radiolytic yields produced when a liquid water jet in vacuum is irradiated with MeV-energy carbon beams. We used secondary ion mass spectrometry to measure the products, such as hydronium cations (H3O+) and hydroxyl anions (OH−), produced along with ·OH radicals, which are significant inducers of DNA damage formation. In addition, we simulated the ionization process in liquid water by incident ions and secondary electrons using a Monte Carlo code for radiation transport. Our results showed that secondary electrons, rather than incident ions, are the primary cause of ionization in water. We found that the production yield of H3O+ or OH− was linked to the frequency of ionization by secondary electrons in water, with these electrons having energies between 10.9 and 550 eV. These electrons are responsible for ionizing the outer-shell electrons of water molecules. Finally, we present that the elementary processes contribute to advancing radiation biophysics and biochemistry, which study the formation mechanism of DNA damage.","PeriodicalId":501648,"journal":{"name":"The Journal of Chemical Physics","volume":"7 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Liquid water radiolysis induced by secondary electrons generated from MeV-energy carbon ions\",\"authors\":\"Hidetsugu Tsuchida, Tomoya Tezuka, Takeshi Kai, Yusuke Matsuya, Takuya Majima, Manabu Saito\",\"doi\":\"10.1063/5.0227465\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Fast ion beams induce damage to deoxyribonucleic acid (DNA) by chemical products, including secondary electrons, produced from interaction with liquid water in living cells. However, the production process of these chemical products in the Bragg peak region used in particle therapy is not fully understood. To investigate this process, we conducted experiments to evaluate the radiolytic yields produced when a liquid water jet in vacuum is irradiated with MeV-energy carbon beams. We used secondary ion mass spectrometry to measure the products, such as hydronium cations (H3O+) and hydroxyl anions (OH−), produced along with ·OH radicals, which are significant inducers of DNA damage formation. In addition, we simulated the ionization process in liquid water by incident ions and secondary electrons using a Monte Carlo code for radiation transport. Our results showed that secondary electrons, rather than incident ions, are the primary cause of ionization in water. We found that the production yield of H3O+ or OH− was linked to the frequency of ionization by secondary electrons in water, with these electrons having energies between 10.9 and 550 eV. These electrons are responsible for ionizing the outer-shell electrons of water molecules. Finally, we present that the elementary processes contribute to advancing radiation biophysics and biochemistry, which study the formation mechanism of DNA damage.\",\"PeriodicalId\":501648,\"journal\":{\"name\":\"The Journal of Chemical Physics\",\"volume\":\"7 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-09-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The Journal of Chemical Physics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1063/5.0227465\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Journal of Chemical Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1063/5.0227465","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
快速离子束与活细胞中的液态水相互作用产生的化学产物(包括次级电子)会对脱氧核糖核酸(DNA)造成损伤。然而,这些化学产物在用于粒子治疗的布拉格峰区域的产生过程还不完全清楚。为了研究这一过程,我们进行了实验,以评估真空中的液态水射流在接受 MeV 能量碳束照射时产生的放射性产物。我们使用二次离子质谱法测量产生的产物,如氢离子(H3O+)和羟基阴离子(OH-),以及-OH 自由基,它们是 DNA 损伤形成的重要诱因。此外,我们还使用蒙特卡洛辐射传输代码模拟了入射离子和二次电子在液态水中的电离过程。我们的结果表明,二次电子而非入射离子是导致水电离的主要原因。我们发现,H3O+ 或 OH- 的产生率与水中二次电子的电离频率有关,这些电子的能量在 10.9 至 550 eV 之间。这些电子负责电离水分子的外层电子。最后,我们介绍了这些基本过程有助于推动研究 DNA 损伤形成机制的辐射生物物理学和生物化学的发展。
Liquid water radiolysis induced by secondary electrons generated from MeV-energy carbon ions
Fast ion beams induce damage to deoxyribonucleic acid (DNA) by chemical products, including secondary electrons, produced from interaction with liquid water in living cells. However, the production process of these chemical products in the Bragg peak region used in particle therapy is not fully understood. To investigate this process, we conducted experiments to evaluate the radiolytic yields produced when a liquid water jet in vacuum is irradiated with MeV-energy carbon beams. We used secondary ion mass spectrometry to measure the products, such as hydronium cations (H3O+) and hydroxyl anions (OH−), produced along with ·OH radicals, which are significant inducers of DNA damage formation. In addition, we simulated the ionization process in liquid water by incident ions and secondary electrons using a Monte Carlo code for radiation transport. Our results showed that secondary electrons, rather than incident ions, are the primary cause of ionization in water. We found that the production yield of H3O+ or OH− was linked to the frequency of ionization by secondary electrons in water, with these electrons having energies between 10.9 and 550 eV. These electrons are responsible for ionizing the outer-shell electrons of water molecules. Finally, we present that the elementary processes contribute to advancing radiation biophysics and biochemistry, which study the formation mechanism of DNA damage.