碲镉汞量子阱中强无序二维半金属的弱反聚焦

IF 0.6 4区 物理与天体物理 Q4 PHYSICS, CONDENSED MATTER
E. B. Olshanetsky, Z. D. Kvon, N. N. Mikhailov
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引用次数: 0

摘要

摘要 对厚度为 d = 20 nm 的高度无序量子阱 CdxHg1 - xTe/HgTe/CdxHg1 - xTe 中的弱局域化进行了实验研究。分析了电荷中性点两侧磁场对电导率干扰修正的抑制所引起的反常正磁阻(APM):二维半金属和二维电子金属。在电阻率值相同的情况下,二维半金属中的 APM 峰的宽度比二维电子气体中的宽得多。将获得的结果与理论进行定量比较,可以得出这样的结论:在二维半金属二元系统中,子系统间载流子跃迁的强度在电荷中性点附近最大,此时电子和空穴的浓度接近,随着浓度差的增大而减小。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Weak Antilocalization in a Strongly Disordered Two-Dimensional Semimetal in an HgTe Quantum Well

Weak Antilocalization in a Strongly Disordered Two-Dimensional Semimetal in an HgTe Quantum Well

Abstract

Weak localization in a highly disordered quantum well CdxHg1 – xTe/HgTe/CdxHg1 – xTe with a thickness of d = 20 nm is experimentally investigated. An analysis is made of the anomalous positive magnetoresistance (APM) caused by the suppression of the interference correction to the conductivity by a magnetic field on both sides of the charge neutrality point: for a two-dimensional semimetal and for a two-dimensional electronic metal. For the same values of resistivity, the APM peak in a 2D semimetal has a much wider width than in a 2D electron gas. A quantitative comparison of the obtained results with the theory allows, in particular, to conclude that the intensity of carrier transitions between subsystems in the 2D semimetal binary system is maximum near the charge neutrality point, where the concentrations of electrons and holes are close, and decreases as the difference in concentrations increases.

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来源期刊
Semiconductors
Semiconductors 物理-物理:凝聚态物理
CiteScore
1.50
自引率
28.60%
发文量
131
审稿时长
3-6 weeks
期刊介绍: Publishes the most important work in semiconductor research in the countries of the former Soviet Union. Covers semiconductor theory, transport phenomena in semiconductors, optics, magnetooptics, and electrooptics of semiconductors, semiconductor lasers and semiconductor surface physics. The journal features an extensive book review section.
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