用于宽带微波焦平面成像的相位控制抛物面反射器

IF 3.7 2区计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Antennas and Wireless Propagation Letters Pub Date : 2024-09-10 DOI:10.1109/LAWP.2024.3454123

Tianheng Wang;Shenshen Luan;Meiling Yang;Yuanyuan Li;Shuguo Xie;Yan Yang

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引用次数: 0

摘要

对于电磁干扰的焦平面成像，根据瑞利准则，系统的点扩散函数（PSF）的大小随频率变化显著。对于具有有限阵列传感器的成像系统，由于PSF小和空间欠采样，高频信号可能会丢失。为了减少成像系统中的频率变化，本文提出并验证了一种宽带相位控制反射器（PCR）。首先，根据反射电磁波的相位响应对相位控制元件（PCE）进行建模和分析。然后，考虑斜入射和周期性结构干涉，设计并优化了PCE在反射面上的分布。实验结果表明，在8 GHz ~ 12 GHz的频率范围内，所提出的PCR能使PSF的3 dB波束宽度平均拓宽60.71%。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A Phase-Controlled Parabolic Reflector for Wideband Microwave Focal-Plane Imaging

For focal-plane imaging of electromagnetic interference, the size of the point spread function (PSF) of the system varies significantly with frequency according to the Rayleigh criterion. For an imaging system with limited array sensors, high-frequency signals may be lost due to small PSF and spatial undersampling. To reduce the frequency variation in imaging systems, a wideband phase-controlled reflector (PCR) is proposed and verified in this article. First, the phase control element (PCE) is modeled and analyzed regarding the phase response of the reflected electromagnetic wave. Then, the distribution of the PCE on the reflector is designed and optimized considering the oblique incidence and periodic structure interference. The experimental results show that the proposed PCR can broaden the 3 dB beamwidth of the PSF by 60.71% averagely over the frequency range of 8 GHz to 12 GHz.

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来源期刊

IEEE Antennas and Wireless Propagation Letters 工程技术-电信学

CiteScore

8.00

自引率

9.50%

发文量

529

审稿时长

1.0 months

期刊介绍： IEEE Antennas and Wireless Propagation Letters (AWP Letters) is devoted to the rapid electronic publication of short manuscripts in the technical areas of Antennas and Wireless Propagation. These are areas of competence for the IEEE Antennas and Propagation Society (AP-S). AWPL aims to be one of the "fastest" journals among IEEE publications. This means that for papers that are eventually accepted, it is intended that an author may expect his or her paper to appear in IEEE Xplore, on average, around two months after submission.