磁控溅射氧化铬薄膜的结构和光学特性

IF 1.8 4区 材料科学 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY
Maria Khalil, Aneeqa Bashir, Umara Khalil, Farman Ullah, Shahid M. Ramay, Murtaza Saleem
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引用次数: 0

摘要

在 Cr2O3 中掺入非金属元素可以调整其特性,使其在传感器或光催化等应用中更加有效。为此,目前的研究工作介绍了掺氮对 Cr2O3 薄膜结构和光学特性的影响。采用直流反应磁控溅射法合成了纯的和掺氮的 Cr2O3(Cr2O3-xNx)薄膜。通过提高 x 值(x = 0、0.125、0.25 和 0.50)获得了化学计量。X 射线衍射分析证实,未掺杂和掺 N 的 Cr2O3 薄膜具有斜方晶体结构,不存在任何其他次生相。此外,结晶度和平均晶粒大小也因掺杂而提高。场发射扫描电子显微镜照片显示,制备的样品表面形态随着掺杂发生了很大变化。通过光谱椭偏仪进行了全面的光学研究。随着掺杂剂含量的增加,一些光学特性发生了明显变化。据观察,掺入 N 后,光带隙从 2.50 eV 减小到 1.82 eV。研究表明,掺杂 N 可改善结构和光学特性,使其成为光电应用的理想候选材料。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Structural and Optical Properties of Magnetron-Sputtered Chromium Oxynitride Thin Films
Doping non-metal elements into Cr2O3 can tailor its properties, making it more efficient for applications like sensors or photocatalysis. For this purpose, the current research work presents the impact of nitrogen doping on the structural and optical properties of Cr2O3 thin films. Pure and N-doped Cr2O3 (Cr2O3−xNx) thin films were synthesized using the DC reactive magnetron sputtering approach. The stoichiometry was obtained by raising values of x, where x = 0, 0.125, 0.25, and 0.50. X-ray diffraction analysis confirmed the rhombohedral crystal structure without the presence of any other secondary phase in undoped and N-doped Cr2O3 thin films. Furthermore, crystallinity and average crystallite size have enhanced by doping. Field emission scanning electron micrographs disclosed that the surface morphology of the prepared samples changed considerably with doping. A thorough optical investigation was carried out by spectroscopic ellipsometry. Several optical properties significantly changed with dopant content. The reduction in the optical bandgap from 2.50 eV to 1.82 eV, with N-doping was observed. The study demonstrated that N-doping improves the structural and optical properties that make it a promising candidate for optoelectronic applications.
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来源期刊
ECS Journal of Solid State Science and Technology
ECS Journal of Solid State Science and Technology MATERIALS SCIENCE, MULTIDISCIPLINARY-PHYSICS, APPLIED
CiteScore
4.50
自引率
13.60%
发文量
455
期刊介绍: The ECS Journal of Solid State Science and Technology (JSS) was launched in 2012, and publishes outstanding research covering fundamental and applied areas of solid state science and technology, including experimental and theoretical aspects of the chemistry and physics of materials and devices. JSS has five topical interest areas: carbon nanostructures and devices dielectric science and materials electronic materials and processing electronic and photonic devices and systems luminescence and display materials, devices and processing.
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