用于离子束诱导荧光显微镜的 YPO4:Gd 粒子紫外光输出实验研究

IF 1.4 3区 物理与天体物理 Q3 INSTRUMENTS & INSTRUMENTATION
Yohei Kikuchi , Shigeo Matsuyama , Shun Kawamura , Fumito Fujishiro , Misako Miwa , Sho Toyama
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引用次数: 0

摘要

基于离子束辐照的多模态显微成像是进行生物研究的一种有用方法,因为它具有不同类型图像之间的精确位置相关性和超越光衍射极限的超分辨率潜力。我们目前正在开发这样一种成像系统,它可以利用亚微米直径的聚焦光束,通过粒子诱导 X 射线发射(PIXE)和离子束诱导荧光(IBIF)显微成像同时获取元素图。为了将该系统应用于实验,合成了一种无机紫外线(UV)荧光粉 YPO4:Gd3+,并优化了 Gd3+ 掺杂浓度,以便用作 IBIF 成像的荧光探针。此外,还尝试用 X 射线束进行其他辐照,以应用于同步辐射。结果,在实验中观察到了荧光。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Experimental investigation on UV light output of YPO4:Gd particles for ion beam induced fluorescence microscopy

Multimodal microscopic imaging based on ion beam irradiation is a useful approach for conducting biological research due to its: accurate positional correlation between different types of images and potential for super resolution beyond the diffraction limit of light. We are currently developing such an imaging system that can simultaneously acquire elemental maps by particle-induced X-ray emission (PIXE) and ion beam-induced fluorescence (IBIF) microscopic imaging employing a sub-micron diameter focused beam. To apply the system to experiments, an inorganic ultraviolet (UV) phosphor, YPO4:Gd3+, was synthesized and Gd3+ dopant concentration was optimized for use as a fluorescent probe for IBIF imaging. Furthermore, other irradiation with X-ray beam was attempted for application to synchrotron radiation. As a result, fluorescence was observed in the experiment.

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来源期刊
CiteScore
2.80
自引率
7.70%
发文量
231
审稿时长
1.9 months
期刊介绍: Section B of Nuclear Instruments and Methods in Physics Research covers all aspects of the interaction of energetic beams with atoms, molecules and aggregate forms of matter. This includes ion beam analysis and ion beam modification of materials as well as basic data of importance for these studies. Topics of general interest include: atomic collisions in solids, particle channelling, all aspects of collision cascades, the modification of materials by energetic beams, ion implantation, irradiation - induced changes in materials, the physics and chemistry of beam interactions and the analysis of materials by all forms of energetic radiation. Modification by ion, laser and electron beams for the study of electronic materials, metals, ceramics, insulators, polymers and other important and new materials systems are included. Related studies, such as the application of ion beam analysis to biological, archaeological and geological samples as well as applications to solve problems in planetary science are also welcome. Energetic beams of interest include atomic and molecular ions, neutrons, positrons and muons, plasmas directed at surfaces, electron and photon beams, including laser treated surfaces and studies of solids by photon radiation from rotating anodes, synchrotrons, etc. In addition, the interaction between various forms of radiation and radiation-induced deposition processes are relevant.
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