具有前瞻性路由拓扑优化功能的分析放置算法

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
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引用次数: 0

摘要

贴装是现代超大规模集成电路设计流程中的关键步骤,因为它极大地决定了电路设计的性能。大多数布局算法使用半周线长(HPWL)估算设计性能,并将其作为优化目标。这些算法使用的线长模型限制了其优化内部路由拓扑的能力,从而导致估计值与实际路由线长之间的差异。本文提出了一种优化内部路由拓扑的分析性布局算法。我们首先基于理想路由拓扑 RSMT,在全局布局阶段引入了一个差分线长模型。通过筛选和跟踪各种线段,该模型可在梯度计算过程中为内部点生成有意义的梯度。然后,在全局布局之后,我们提出了一种单元细化算法,并通过快速密度控制进一步优化路由线长。在 ICCAD2015 基准上进行的实验表明,与最先进的分析放置器相比,我们的算法可实现 3% 的路由线长改进、0.8% 的 HPWL 改进和 23.8% 的 TNS 改进。在工业基准上,我们的算法还能将路由线长提高 10.6%,将 WNS 提高 27.3%,将 TNS 提高 34.4%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An analytical placement algorithm with looking-ahead routing topology optimization

Placement is a critical step in the modern VLSI design flow, as it dramatically determines the performance of circuit designs. Most placement algorithms estimate the design performance with a half-perimeter wirelength (HPWL) and target it as their optimization objective. The wirelength model used by these algorithms limits their ability to optimize the internal routing topology, which can lead to discrepancies between estimates and the actual routing wirelength. This paper proposes an analytical placement algorithm to optimize the internal routing topology. We first introduce a differential wirelength model in the global placement stage based on an ideal routing topology RSMT. Through screening and tracing various segments, this model can generate meaningful gradients for interior points during gradient computation. Then, after global placement, we propose a cell refinement algorithm and further optimize the routing wirelength with swift density control. Experiments on ICCAD2015 benchmarks show that our algorithm can achieve a 3% improvement in routing wirelength, 0.8% in HPWL, and 23.8% in TNS compared with the state-of-the-art analytical placer. On industrial benchmarks, our algorithm can also achieve a 10.6% improvement in routing wirelength, 27.3% in WNS, and 34.4% in TNS.

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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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