利用注册和单元平均技术,通过 STEM-EDS 对拓扑绝缘体中的稀释掺杂物进行原子尺度表征。

IF 2.9 4区 工程技术 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY
Min-Chul Kang, Farhan Islam, Jiaqiang Yan, David Vaknin, Robert J McQueeney, Ping Lu, Lin Zhou
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引用次数: 0

摘要

三维拓扑绝缘体(TIs)中的磁性掺杂剂为在无需外部磁场的情况下实现量子反常霍尔效应(QAHE)提供了一条前景广阔的途径。了解磁性掺杂元素的位点占有率与其对宏观特性的影响之间的关系对于控制 QAHE 至关重要。通过将像差校正扫描透射电子显微镜(AC-STEM)获得的原子尺度能量色散 X 射线光谱(EDS)图与新颖的数据处理方法(包括半自动晶格平均化和帧注册)相结合,我们确定了 1.2% 锰掺杂 Sb2Te3 晶体中锰原子的置换位点。更重要的是,本研究开发的方法不仅适用于掺锰 Sb2Te3,还适用于其他量子材料、传统半导体,甚至电子辐照敏感材料。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Atomic-Scale Characterization of Dilute Dopants in Topological Insulators via STEM-EDS Using Registration and Cell Averaging Techniques.

Magnetic dopants in three-dimensional topological insulators (TIs) offer a promising avenue for realizing the quantum anomalous Hall effect (QAHE) without the necessity for an external magnetic field. Understanding the relationship between site occupancy of magnetic dopant elements and their effect on macroscopic property is crucial for controlling the QAHE. By combining atomic-scale energy-dispersive X-ray spectroscopy (EDS) maps obtained by aberration-corrected scanning transmission electron microscopy (AC-STEM) and novel data processing methodologies, including semi-automatic lattice averaging and frame registration, we have determined the substitutional sites of Mn atoms within the 1.2% Mn-doped Sb2Te3 crystal. More importantly, the methodology developed in this study extends beyond Mn-doped Sb2Te3 to other quantum materials, traditional semiconductors, and even electron irradiation sensitive materials.

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来源期刊
Microscopy and Microanalysis
Microscopy and Microanalysis 工程技术-材料科学:综合
CiteScore
1.10
自引率
10.70%
发文量
1391
审稿时长
6 months
期刊介绍: Microscopy and Microanalysis publishes original research papers in the fields of microscopy, imaging, and compositional analysis. This distinguished international forum is intended for microscopists in both biology and materials science. The journal provides significant articles that describe new and existing techniques and instrumentation, as well as the applications of these to the imaging and analysis of microstructure. Microscopy and Microanalysis also includes review articles, letters to the editor, and book reviews.
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