测试在原子探针断层扫描中识别早期溶质团的离群值检测算法。

IF 2.9 4区 工程技术 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY
Ryan S Stroud, Ayham Al-Saffar, Megan Carter, Michael P Moody, Stella Pedrazzini, Mark R Wenman
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引用次数: 0

摘要

原子探针层析成像(APT)通常用于研究材料中的溶质聚类和沉淀。然而,用于识别和描述原子探针数据中的聚类的标准技术,如基于密度的空间聚类噪声应用(DBSCAN),往往在小聚类方面表现不佳。这是基于密度的聚类识别算法的局限性,因为它们依赖于参数 Nmin,而 Nmin 是对可探测聚类大小的任意下限。因此,本文尝试将原子探针数据中的聚类特征描述视为离群点检测问题,通过模拟数据集测试了 k 近邻局部离群点因子和基于可学习统一邻域的异常排序算法,并将其与标准方法进行了比较。然后,算法输出的判定分数通过 Karcher 平均值自动阈值化,以消除人为偏差。在使用模拟数据对 30 个原子的聚类大小进行测试时,每个主要模型的性能都优于 DBSCAN。不过,新提出的 k-近邻(k-NN)和 DBSCAN 组合方法在所有聚类规模下都表现出色。本文提出的 k-NN 和七种组合方法是在 APT 中识别聚类的一种新方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Testing Outlier Detection Algorithms for Identifying Early Stage Solute Clusters in Atom Probe Tomography.

Atom probe tomography (APT) is commonly used to study solute clustering and precipitation in materials. However, standard techniques used to identify and characterize clusters within atom probe data, such as the density-based spatial clustering applications with noise (DBSCAN), often underperform with respect to small clusters. This is a limitation of density-based cluster identification algorithms, due to their dependence on the parameter Nmin, an arbitrary lower limit placed on detectable cluster sizes. Therefore, this article attempts to consider the characterization of clustering in atom probe data as an outlier detection problem of which k-nearest neighbors local outlier factor and learnable unified neighborhood-based anomaly ranking algorithms were tested against a simulated dataset and compared to the standard method. The decision score output of the algorithms was then auto thresholded by the Karcher mean to remove human bias. Each of the major models tested outperforms DBSCAN for cluster sizes of <25 atoms but underperforms for sizes >30 atoms using simulated data. However, the new combined k-nearest neighbors (k-NN) and DBSCAN method presented was able to perform well at all cluster sizes. The combined k-NN and seven methods are presented as a new approach to identifying clusters in APT.

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来源期刊
Microscopy and Microanalysis
Microscopy and Microanalysis 工程技术-材料科学:综合
CiteScore
1.10
自引率
10.70%
发文量
1391
审稿时长
6 months
期刊介绍: Microscopy and Microanalysis publishes original research papers in the fields of microscopy, imaging, and compositional analysis. This distinguished international forum is intended for microscopists in both biology and materials science. The journal provides significant articles that describe new and existing techniques and instrumentation, as well as the applications of these to the imaging and analysis of microstructure. Microscopy and Microanalysis also includes review articles, letters to the editor, and book reviews.
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