基于激光诱导等离子体和机器学习的复合绝缘体缺陷检测

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Shuaiqi Xu, Changjin Che
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引用次数: 0

摘要

由于长期运行和外部环境因素,复合绝缘子可能会出现各种缺陷,从而可能导致电力系统发生严重事故。检测和分析这些缺陷至关重要。在本研究中,我们将机器学习与激光诱导击穿光谱(LIBS)相结合,识别复合绝缘子中的缺陷,并从有缺陷和无缺陷的样品中获取光谱数据。研究采用了均匀簇逼近和投影算法来降低数据的维度,从而提高了检测的准确性和效率。采用决策树、随机森林(RF)、K-近邻和支持向量机算法对降维后的数据进行分类。结果表明,RF 算法的分类性能最好,训练集和测试集的准确率分别为 100%和 95.46%。此外,反映模型性能的精确度、召回率和 F1 分数也显示出 RF 算法的优越性。这些研究结果表明,LIBS 技术与机器学习的结合可以快速准确地检测和分析复合绝缘子中的缺陷,为复合绝缘子的缺陷检测提供了新的见解和方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Detection of defects in composite insulators based on laser-induced plasma combined with machine learning

Due to Prolonged operation and external environmental factors, composite insulators may develop various defects, which can potentially lead to serious accidents in power systems. Detecting and analyzing these defects is critically important. In this study, we combine machine learning with laser-induced breakdown spectroscopy (LIBS) to identify defects in composite insulators and obtain spectral data from both defective and nondefective samples. The Uniform Manifold Approximation and Projection algorithm was employed to reduce the dimensionality of the data, thereby enhancing detection accuracy and efficiency. Decision tree, random forest (RF), K-nearest neighbor, and support vector machine algorithms were used to classify the dimensionality-reduced data. The results indicate that the RF algorithm achieved the best classification performance, with accuracies of 100% and 95.46% for the training and test sets, respectively. Furthermore, the precision, recall, and F1 scores, which reflect model performance, also showed superior results with the RF algorithm. These findings suggest that the combination of LIBS technology and machine learning can rapidly and accurately detect and analyze defects in composite insulators, offering new insights and methods for defect detection in composite insulators.

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来源期刊
Microwave and Optical Technology Letters
Microwave and Optical Technology Letters 工程技术-工程:电子与电气
CiteScore
3.40
自引率
20.00%
发文量
371
审稿时长
4.3 months
期刊介绍: Microwave and Optical Technology Letters provides quick publication (3 to 6 month turnaround) of the most recent findings and achievements in high frequency technology, from RF to optical spectrum. The journal publishes original short papers and letters on theoretical, applied, and system results in the following areas. - RF, Microwave, and Millimeter Waves - Antennas and Propagation - Submillimeter-Wave and Infrared Technology - Optical Engineering All papers are subject to peer review before publication
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