利用循环切割技术缓解加密应用侧信道攻击的存储器架构

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Aastha Gupta, Ravi Sindal, Vaibhav Neema
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引用次数: 0

摘要

在嵌入式系统中,加密技术对保护敏感信息、维护数据完整性和促进安全通信至关重要。L1 高速缓冲存储器通过临时存储加密密钥来提高整体性能。后量子密码学(PQC)侧重于创建即使在量子计算威胁下也能保持安全的算法。然而,PQC 并不能完全抵御侧信道攻击(SCA)。随着可穿戴健康监测器和工业传感器等物联网设备的普及,人们对轻量级加密技术的需求也随之增加,以便在安全性和资源限制之间取得平衡。然而,轻量级加密技术可能面临一些挑战,包括安全性降低,以及由于密钥规模较小而更易受 SCA 影响。攻击者可以通过侧信道攻击(SCA)(如功率分析)利用功耗模式来提取这些密钥。密钥一旦泄露,加密数据就会变得脆弱。在云计算缓存中,侧信道攻击可以利用在同一硬件上同时运行的多个虚拟机,从而从加密过程中提取敏感信息。尽管文献中已经设计了许多 SRAM 单元,但没有一个能提供针对 SCA 的完全安全性。本文介绍了一种新的安全高速缓冲存储器架构,该架构采用了一种拟议的 10T SRAM 单元,可确保所有三种单元操作(读取、写入和保持)免受 SCA 攻击。此外,该架构还能防止高速缓冲存储器中的半选择问题。该单元还具有最高的保持稳定性(421 mV),以及良好的读取稳定性和写入能力(分别为 220 mV 和 334 mV)。Proposed-10T 电池的漏电流也较低,仅为 13.56 pA。性能和安全系数(PSF)是为所有考虑的电池计算的,包括各种性能和安全指标。建议的 10T 单元的归一化 PSF(PSF)N 为 2.17,是所有比较单元中最高的。因此,建议的 10T 小区架构可完全安全地抵御 SCA,并在小区运行期间实现更好的性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Memory architecture to mitigate side channel attacks for cryptographic application using loop cut technique

Cryptography is crucial in embedded systems for safeguarding sensitive information, maintaining data integrity, and facilitating secure communication. L1 cache memory enhances overall performance by temporarily storing cryptographic keys. Post-quantum cryptography (PQC) focuses on creating algorithms that stay secure even against quantum computing threats. However, PQC doesn't fully protect against side-channel attacks (SCA). As IoT devices like wearable health monitors and industrial sensors become more widespread, the demand for lightweight cryptography increases to balance security with resource constraints. Yet, lightweight cryptography can face challenges, including reduced security and increased susceptibility to SCA due to smaller key sizes. Attackers can exploit power consumption patterns through side-channel attacks (SCA), such as Power Analysis, to extract these secret keys. Once a key is compromised, encrypted data becomes vulnerable. In cloud computing cache side-channel attacks take advantage of multiple virtual machines running simultaneously on the same hardware, enabling them to extract sensitive information from encryption processes. Although many SRAM cells have been designed in the literature, none offer complete security against SCA. This paper presents a new architecture for secure cache memory using a proposed 10T SRAM cell that secures all three cell operations (read, write, and hold) against SCA attacks. Additionally, this architecture also prevents half selection issue in cache memory. The security measure of proposed-10T cell is 97.19 % which is highest among all other cells and reliability measure is 82.03 %.The cell also offers highest hold stability of 421 mV along with good read stability and write ability of 220 mV and 334 mV respectively. The leakage of Proposed-10T cell is also less i.e., 13.56 pA. The Performance and Security Factor (PSF) is computed for all considered cells, encompassing various performance and security metrics. The normalized PSF (PSF)N of the Proposed-10T cell is 2.17, the highest among all cells considered for comparison. Therefore, the Proposed-10T cell architecture is fully secure against SCA and achieves better performance during cell operations.

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来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
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