基于 PEEC 的高效微带结构全波分析方法

IF 2 3区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Jinyan Ma;Da Li;Hanzhi Ma;Ruifeng Li;Ling Zhang;Michal Mrozowski;Er-Ping Li
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引用次数: 0

摘要

本文介绍了一种利用全波部分元素等效电路(PEEC)对微带结构进行等效电路表征和全波分析的高效方法。特别是,采用离散复像法(DCIM)评估多层格林函数,并利用该方法建立混合势积分方程。所提出的策略考虑了延迟电耦合和磁耦合的时间延迟,提供了一种新的高效全波方法来提取等效电路成分,其中包含了准静态、表面波和复像的贡献。值得注意的是,所提出的全波 PEEC 策略允许将 DCIM 得出的每个分量贡献有效地表示为与频率无关的块状电路元件和相应的频率因数,从而简化了传统 PEEC 方法中整个与频率有关的块状元件的提取过程。此外,所提出的 PEEC 模型还配备了全波等效电路,可为电磁行为提供清晰的物理洞察,从而促进设计和优化。最后,通过各种实例和实验充分证明了所提出的 PEEC 模型的准确性和高效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An Efficient PEEC-Based Method for Full-Wave Analysis of Microstrip Structures
This article introduces an efficient method for the equivalent circuit characterization and full-wave analysis of microstrip structures, leveraging the full-wave partial element equivalent circuit (PEEC). In particular, the multilayered Green's function is evaluated using the discrete complex-image method (DCIM) and employed to establish the mixed potential integral equations. The proposed strategy considers time delays for the retarded electric and magnetic couplings, offering a new efficient full-wave approach to extract equivalent circuit components, which encapsulate the contributions of the quasi-static, surface-wave, and complex images. It is noted that the proposed full-wave PEEC strategy allows each component contribution derived from DCIM to be efficiently represented as frequency-independent lumped circuit elements and corresponding frequency factors, thereby simplifying the extraction process of the entire frequency-dependent lumped elements in the traditional PEEC method. Moreover, the proposed PEEC model, equipped with full-wave equivalent circuits, offers clear physical insight into electromagnetic behaviors, thereby facilitating design and optimization. Finally, the accuracy and efficiency of the proposed PEEC model are fully demonstrated through various examples and experiments.
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来源期刊
CiteScore
4.80
自引率
19.00%
发文量
235
审稿时长
2.3 months
期刊介绍: IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.
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