在 3D-EBSD 中使用相干孪生边界作为内部参考的配准算法。

IF 1.5 4区 工程技术 Q3 MICROSCOPY
Heng Li, Shuang Xia, Qin Bai, Tingguang Liu, Yong Zhang
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引用次数: 0

摘要

通过对 316L 奥氏体不锈钢进行连续切片和电子背散射衍射(EBSD)绘图,从二维切片堆栈中重建了三维(3D)微结构体。我们提出了一种名为 "最小化指标线性平移(LTMI)"的新配准算法,通过参照平坦且位于{111}面上的相干孪晶边界来减少相邻切片之间的平移错位。平面孪晶边界的测量方向与{111}平面的测量方向之间的角度差被用作对准操作精度的指标。该指标通过三角形面中心点的线性平移最小化,三角形面构成晶界的距离不受 EBSD 地图面内步长的限制。因此可以有效地减少平移错位的系统趋势。本文提出的 LTMI 配准程序可以有效地纠正其他方法在使用序列切片方法制备的三维 EBSD 数据上残留的错位。区分相干和非相干孪晶边界的准确性显著提高。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An alignment algorithm using coherent twin boundaries as internal reference in 3D-EBSD.

A three-dimensional (3D) microstructural volume is reconstructed from a stack of two-dimensional sections which was obtained by serial sectioning coupled with electron back scattering diffraction (EBSD) mapping of a 316L austenitic stainless steel. A new alignment algorithm named linear translation by minimising the indicator (LTMI) is proposed to reduce the translational misalignments between adjacent sections by referencing to coherent twin boundaries which are flat and lying on {111} planes. The angular difference between the measured orientation of a flat twin boundary and that of the {111} plane is used as an indicator of the accuracy of the alignment operations. This indicator is minimised through linear translations of the centroids of triangular facets, which constitute grain boundaries at a distance not restricted by the in-plane step size of the EBSD maps. And hence the systematic trend in the translational misalignments can be effectively reduced. The LTMI alignment procedure proposed herein effectively corrects the misalignments remained by other methods on a 3D-EBSD data prepared using serial sectioning methods. The accuracy in distinguishing between coherent and incoherent twin boundaries is significantly improved.

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来源期刊
Journal of microscopy
Journal of microscopy 工程技术-显微镜技术
CiteScore
4.30
自引率
5.00%
发文量
83
审稿时长
1 months
期刊介绍: The Journal of Microscopy is the oldest journal dedicated to the science of microscopy and the only peer-reviewed publication of the Royal Microscopical Society. It publishes papers that report on the very latest developments in microscopy such as advances in microscopy techniques or novel areas of application. The Journal does not seek to publish routine applications of microscopy or specimen preparation even though the submission may otherwise have a high scientific merit. The scope covers research in the physical and biological sciences and covers imaging methods using light, electrons, X-rays and other radiations as well as atomic force and near field techniques. Interdisciplinary research is welcome. Papers pertaining to microscopy are also welcomed on optical theory, spectroscopy, novel specimen preparation and manipulation methods and image recording, processing and analysis including dynamic analysis of living specimens. Publication types include full papers, hot topic fast tracked communications and review articles. Authors considering submitting a review article should contact the editorial office first.
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