机器学习驱动的模拟电路设计全局优化框架

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
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引用次数: 0

摘要

本文提出了一种机器学习驱动的模拟电路设计优化框架。基于机器学习的全局离线代用模型以电路设计参数为输入,在所研究的模拟电路设计空间中建立,用于指导优化算法实现最佳电路设计,从而加快收敛速度并减少 Spice 仿真数量。多层感知器和随机森林回归器用于预测模拟电路所需的设计规格。多层感知器分类器用于预测电路中每个晶体管的饱和状态。我们使用三种电路拓扑结构--带隙基准、折叠级联运算放大器和两级运算放大器--验证了所提出的框架。仿真结果表明,收敛后的适配函数具有更好的最佳值和更低的标准偏差,在本研究考虑的三个测试案例中,与标准方法相比,调用调料的次数分别减少了 56%、59% 和 83%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Machine learning driven global optimisation framework for analog circuit design

We propose a machine learning-driven optimisation framework for analog circuit design in this paper. Machine learning based global offline surrogate models, with the circuit design parameters as the input, are built in the design space for the analog circuits under study and are used to guide the optimisation algorithm towards an optimal circuit design, resulting in faster convergence and reduced number of spice simulations. Multi-layer perceptron and random forest regressors are employed to predict the required design specifications of the analog circuit. Multi-layer perceptron classifiers are used to predict the saturation condition of each transistor in the circuit. We validate the proposed framework using three circuit topologies—a bandgap reference, a folded cascode operational amplifier, and a two-stage operational amplifier. The simulation results show better optimum values and lower standard deviations for fitness functions after convergence, with a reduction in spice calls by 56%, 59%, and 83% when compared with standard approaches in the three test cases considered in the study.

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来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
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