提高传感器采样频率对边缘处理系统在容忍中子造成的软误差方面的可靠性的影响

IF 2.2 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Sensors Letters Pub Date : 2024-07-30 DOI:10.1109/LSENS.2024.3435677

Matheus Minelli de Carvalho;L. H. Laurini;E. Atukpor;L. Naviner;Rodrigo Possamai Bastos

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引用次数: 0

摘要

在这封信中，我们揭示了提高传感器采样频率对在 14-MeV 中子和热中子作用下运行的典型边缘处理系统可靠性的影响。两种加速辐射测试的结果表明，14-MeV 中子和热中子引起的软误差导致的故障率随传感器采样频率的增加而增加。传感器采样频率从 140 赫兹左右提高到 430 赫兹后，14-MeV 中子引起的故障率上升了 2.2 倍。研究结果还表明，在设计和校准边缘处理系统时，应将传感器采样频率作为一个参数，以便对系统的计算速度进行微妙的权衡，从而提高系统在容忍中子引起的软误差方面的可靠性。

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Impact of Scaling Up the Sensor Sampling Frequency on the Reliability of Edge Processing Systems in Tolerating Soft Errors Caused by Neutrons

In this letter, we reveal the impact of increasing the sensor sampling frequency on the reliability of a typical edge processing system operating under the effects of 14-MeV neutrons and thermal neutrons. The results of two types of accelerated radiation tests indicate the rates of failures induced by soft errors caused by 14-MeV and thermal neutrons grow as a function of the sensor sampling frequency. The rate of failures caused by 14-MeV neutrons rose by factor of 2.2 by shifting the sensor sampling frequency from around 140 to 430 Hz. The results also suggest that the design and calibration of edge processing systems should consider the sensor sampling frequency as a parameter to finely tradeoff the computing speed of the system for improving the reliability in tolerating soft errors caused by neutrons.

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来源期刊

IEEE Sensors Letters Engineering-Electrical and Electronic Engineering

CiteScore

3.50

自引率

7.10%

发文量

194