{"title":"时间交错 ADC 时序失配的全数字低复杂度盲背景校准","authors":"Wei Zhong , Lili Lang , Yemin Dong","doi":"10.1016/j.mejo.2024.106357","DOIUrl":null,"url":null,"abstract":"<div><p>This paper proposed a novel all-digital blind background calibration to mitigate timing mismatch in time-interleaved analog-to-digital converter (TIADC). In estimation module, the adoption of a subtraction-based error extraction function and the design of Variable-Step-Size Least Mean Squares algorithm contribute to reducing the computational complexity and enhancing the convergence speed with optimal output accuracy respectively. In compensation module, a dual-stage Taylor series expansion structure has been introduced to effectively maintain the overall output performance. The proposed architecture is applied to a 12-bit 3 GS/s four-channel TIADC model. Its effectiveness for single-tone and multi-tone signals is proven through systematical testing and analysis. The simulation results exhibit that the Spurious Free Dynamic Range is significantly improved by 54.53 dB in the single-tone signal case, and the timing mismatch is converged after 1000 samples. The proposed calibration circuit has been synthesized utilizing a 28 nm standard cell library for assessing its hardware consumption, area (0.051 mm<sup>2</sup>) and average power dissipation (67.5 mW) within the integrated chip architecture. Our technology provides a viable optimization solution to improve efficiency of TIADC in high-speed systems.</p></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":null,"pages":null},"PeriodicalIF":1.9000,"publicationDate":"2024-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An all-digital low-complexity blind background calibration of timing mismatch in time-interleaved ADCs\",\"authors\":\"Wei Zhong , Lili Lang , Yemin Dong\",\"doi\":\"10.1016/j.mejo.2024.106357\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>This paper proposed a novel all-digital blind background calibration to mitigate timing mismatch in time-interleaved analog-to-digital converter (TIADC). In estimation module, the adoption of a subtraction-based error extraction function and the design of Variable-Step-Size Least Mean Squares algorithm contribute to reducing the computational complexity and enhancing the convergence speed with optimal output accuracy respectively. In compensation module, a dual-stage Taylor series expansion structure has been introduced to effectively maintain the overall output performance. The proposed architecture is applied to a 12-bit 3 GS/s four-channel TIADC model. Its effectiveness for single-tone and multi-tone signals is proven through systematical testing and analysis. The simulation results exhibit that the Spurious Free Dynamic Range is significantly improved by 54.53 dB in the single-tone signal case, and the timing mismatch is converged after 1000 samples. The proposed calibration circuit has been synthesized utilizing a 28 nm standard cell library for assessing its hardware consumption, area (0.051 mm<sup>2</sup>) and average power dissipation (67.5 mW) within the integrated chip architecture. Our technology provides a viable optimization solution to improve efficiency of TIADC in high-speed systems.</p></div>\",\"PeriodicalId\":49818,\"journal\":{\"name\":\"Microelectronics Journal\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2024-08-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectronics Journal\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S1879239124000614\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1879239124000614","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
An all-digital low-complexity blind background calibration of timing mismatch in time-interleaved ADCs
This paper proposed a novel all-digital blind background calibration to mitigate timing mismatch in time-interleaved analog-to-digital converter (TIADC). In estimation module, the adoption of a subtraction-based error extraction function and the design of Variable-Step-Size Least Mean Squares algorithm contribute to reducing the computational complexity and enhancing the convergence speed with optimal output accuracy respectively. In compensation module, a dual-stage Taylor series expansion structure has been introduced to effectively maintain the overall output performance. The proposed architecture is applied to a 12-bit 3 GS/s four-channel TIADC model. Its effectiveness for single-tone and multi-tone signals is proven through systematical testing and analysis. The simulation results exhibit that the Spurious Free Dynamic Range is significantly improved by 54.53 dB in the single-tone signal case, and the timing mismatch is converged after 1000 samples. The proposed calibration circuit has been synthesized utilizing a 28 nm standard cell library for assessing its hardware consumption, area (0.051 mm2) and average power dissipation (67.5 mW) within the integrated chip architecture. Our technology provides a viable optimization solution to improve efficiency of TIADC in high-speed systems.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.
Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.