采用粗微调 VCO 和改进型 DQFD 的 1-6.5 Gbps 双环 CDR 设计

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
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引用次数: 0

摘要

介绍了一种双环 CDR(时钟和数据恢复),用于恢复 1 至 6.5 Gbps 的数字数据。所介绍的频率采集技术基于全速率时钟架构。通过利用改进的数字四重相关器频率检测器(DQFD)和频率增减控制电路,提高了锁定范围。此外,在宽频率范围检测时的状态丢失问题也得到了成功缓解。在粗细调谐 VCO 中加入两根控制线,使双回路中可以使用独立的环路滤波器,从而更有效地降低噪声和抖动。利用 40 纳米 CMOS 工艺实现了所介绍的 CDR 设计。6.5 Gbps 的布局后仿真结果显示,重定时数据的 P2P 和均方根抖动值分别为 17.1 ps 和 5.79 ps。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

A 1–6.5 Gbps dual-loop CDR design with Coarse-fine Tuning VCO and modified DQFD

A 1–6.5 Gbps dual-loop CDR design with Coarse-fine Tuning VCO and modified DQFD

A dual-loop CDR (Clock and Data Recovery) is presented to recover digital data from 1 to 6.5 Gbps. The presented frequency acquisition technique is based on full rate clock architecture. By utilizing modified Digital Quadri-correlator Frequency Detector (DQFD) and Frequency Increment/Decrement Control circuit, the lock-in range is improved. Furthermore, the issue of state loss during wide frequency range detection is successfully mitigated. The inclusion of two control wires in the Coarse-fine Tuning VCO enables the utilization of separate loop filters in the dual loops, resulting in a more effective reduction of noise and jitter. Utilizing a 40-nm CMOS process, the presented CDR design has been implemented. The post-layout simulation results at 6.5 Gbps shows a P2P and root-mean-square jitter values are 17.1 ps and 5.79 ps, respectively, for the retimed data.

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来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
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