Mengyue Tian;James J. Bell;Roberto Quaglia;Ehsan M. Azad;Paul J. Tasker
{"title":"人工神经网络非线性晶体管行为模型:基于卡迪夫模型的结构和参数确定过程","authors":"Mengyue Tian;James J. Bell;Roberto Quaglia;Ehsan M. Azad;Paul J. Tasker","doi":"10.1109/TMTT.2024.3434959","DOIUrl":null,"url":null,"abstract":"This article introduces a novel artificial neural network (ANN) structure determination process based on the Cardiff model (CM), to determine ANN-based transistor nonlinear behavioral models. By relating the CM formulation and coefficients to the Taylor series expansion of the ANN model, a novel approach for determining the required values of a fully connected cascaded (FCC) ANN structure has been formulated. The proposed method provides the chance to escape from the possible time-consuming ANN determination process. Experiments proved that the proposed ANN models using the determination method can provide accurate prediction for the behavior acquired from load-pull characterizations of a Wolfspeed 10-W packaged gallium nitride (GaN) high electron mobility transistor (HEMT) simulation at 3.5 GHz, and a dense load-pull measurement of WIN NP<inline-formula> <tex-math>$12 4 \\,\\, \\times 75~\\mu $ </tex-math></inline-formula>m GaN HEMT at 20 GHz, with normalized mean square error (NMSE) levels lower than −40 dB.","PeriodicalId":13272,"journal":{"name":"IEEE Transactions on Microwave Theory and Techniques","volume":"73 2","pages":"745-759"},"PeriodicalIF":4.1000,"publicationDate":"2024-08-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Artificial Neural Network Nonlinear Transistor Behavioral Models: Structure and Parameter Determination Process Based on the Cardiff Model\",\"authors\":\"Mengyue Tian;James J. Bell;Roberto Quaglia;Ehsan M. Azad;Paul J. Tasker\",\"doi\":\"10.1109/TMTT.2024.3434959\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article introduces a novel artificial neural network (ANN) structure determination process based on the Cardiff model (CM), to determine ANN-based transistor nonlinear behavioral models. By relating the CM formulation and coefficients to the Taylor series expansion of the ANN model, a novel approach for determining the required values of a fully connected cascaded (FCC) ANN structure has been formulated. The proposed method provides the chance to escape from the possible time-consuming ANN determination process. Experiments proved that the proposed ANN models using the determination method can provide accurate prediction for the behavior acquired from load-pull characterizations of a Wolfspeed 10-W packaged gallium nitride (GaN) high electron mobility transistor (HEMT) simulation at 3.5 GHz, and a dense load-pull measurement of WIN NP<inline-formula> <tex-math>$12 4 \\\\,\\\\, \\\\times 75~\\\\mu $ </tex-math></inline-formula>m GaN HEMT at 20 GHz, with normalized mean square error (NMSE) levels lower than −40 dB.\",\"PeriodicalId\":13272,\"journal\":{\"name\":\"IEEE Transactions on Microwave Theory and Techniques\",\"volume\":\"73 2\",\"pages\":\"745-759\"},\"PeriodicalIF\":4.1000,\"publicationDate\":\"2024-08-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Microwave Theory and Techniques\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10623296/\",\"RegionNum\":1,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Microwave Theory and Techniques","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10623296/","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Artificial Neural Network Nonlinear Transistor Behavioral Models: Structure and Parameter Determination Process Based on the Cardiff Model
This article introduces a novel artificial neural network (ANN) structure determination process based on the Cardiff model (CM), to determine ANN-based transistor nonlinear behavioral models. By relating the CM formulation and coefficients to the Taylor series expansion of the ANN model, a novel approach for determining the required values of a fully connected cascaded (FCC) ANN structure has been formulated. The proposed method provides the chance to escape from the possible time-consuming ANN determination process. Experiments proved that the proposed ANN models using the determination method can provide accurate prediction for the behavior acquired from load-pull characterizations of a Wolfspeed 10-W packaged gallium nitride (GaN) high electron mobility transistor (HEMT) simulation at 3.5 GHz, and a dense load-pull measurement of WIN NP$12 4 \,\, \times 75~\mu $ m GaN HEMT at 20 GHz, with normalized mean square error (NMSE) levels lower than −40 dB.
期刊介绍:
The IEEE Transactions on Microwave Theory and Techniques focuses on that part of engineering and theory associated with microwave/millimeter-wave components, devices, circuits, and systems involving the generation, modulation, demodulation, control, transmission, and detection of microwave signals. This includes scientific, technical, and industrial, activities. Microwave theory and techniques relates to electromagnetic waves usually in the frequency region between a few MHz and a THz; other spectral regions and wave types are included within the scope of the Society whenever basic microwave theory and techniques can yield useful results. Generally, this occurs in the theory of wave propagation in structures with dimensions comparable to a wavelength, and in the related techniques for analysis and design.